VILLA, P.BEZERRA, E.GOERL, R.POEHLS, L.VARGA, F.MEDINA N.ADDED, N.DE AGUIAR, V.MACCHIORE, E.AGUIRRE, F.Marcilei Aparecida Guazzelli2022-01-122022-01-122017-07-31VILLA, P.; BEZERRA, E.; GOERL, R.; POEHLS, L.; VARGA, F.; MEDINA N.; ADDED, N.; DE AGUIAR, V.; MACCHIORE, E.; AGUIRRE, F.; GUAZZELLI, M. A. Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TID. Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, p. 27-32, jul. 2017.https://repositorio.fei.edu.br/handle/FEI/3834© 2017 IEEE.The desirable use of Field-Programmable Gate Arrays (FGPAs) in aerospace & defense field has become a general consensus among IC and embedded system designers. Radiation-hardened (rad-hard) electronics used in this domain is regulated under severe and complex political and commercial treaties. In order to refrain from these undesired political and commercial barriers component-off-the-shelf (COTS) FPGAs (despite the fact of their low reliability) have been considered as a promising alternative to replace rad-hard ICs. In this scenario, this paper analyses the Single-Event Upset (SEU) sensitivity of the Microsemi ProASIC3E A3PE1500 COTS FPGA for a combined set of Electromagnetic Interference (EMI) and Total-Ionizing Dose (TID) tests. This component is under pre-qualification process for use in some satellites of the Brazilian Space Program. Experimental results are herein briefly presented and discussed. These results allow us to consider this component as a strong candidate to replace rad-hard FPGAs, if its use is combined with strict system-level fault-tolerant strategies for error detection and correction (EDAC).Acesso RestritoArtigo de evento10.1109/EMCCompo.2017.7998076Combined Qualification Test for EMICOTSFPGAMicrosemi ProAsic3ESEU and TIDSEU Sensitivity