NOVO, C. D.BAPTISTA, J.Marcilei Aparecida GuazzelliRenato GiacominiAFZALIAN, A.FLANDRE, D.2022-01-122022-01-122015NOVO, C. D.; BAPTISTA, J.; GUAZZELLI, M.A.; GIACOMINI, R.; AFZALIAN, A.; FLANDRE, D. Study of total quantum efficiency of lateral SOI PIN photodiodes with back-gate bias, intrinsic length and temperature variation. ECS Transactions, v. 66, n. 5, p. 101-107, 2015.1938-6737https://repositorio.fei.edu.br/handle/FEI/3989© The Electrochemical Society.This paper addresses, for the first time, an analysis of the total quantum efficiency of lateral SOI PIN photodiodes with different intrinsic lengths in the 300 to 500 K range simultaneously considering back-gate bias and temperature influences. Experimental results showed that the mode of operation changes the behavior of the devices concerning dark and photocurrents, while the temperature variation produces different trades in quantum efficiency related to the absorption length and the diffusion length variation.Acesso RestritoArtigo de evento10.1149/06605.0101ecst