Back-Biased Undoped Nanowire-Based FETs in Silicon-On-Insulator Substrates with Nanometric Thicknesses

NEMER, Juliana P.PUYDINGER, M.DINIZ, José AlexandrePAVANELLO, Marcelo A.2019-08-192019-08-192018NEMER, Juliana P.; PUYDINGER, M.; DINIZ, José Alexandre; PAVANELLO, Marcelo A.. Back-Biased Undoped Nanowire-Based FETs in Silicon-On-Insulator Substrates with Nanometric Thicknesses. Journal of Nanoelectronics and Optoelectronics, v. 13, p. 178-182, 2018.1555-130Xhttps://repositorio.fei.edu.br/handle/FEI/1130Acesso RestritoBack-Biased Undoped Nanowire-Based FETs in Silicon-On-Insulator Substrates with Nanometric ThicknessesArtigo10.1166/jno.2018.2228