DE SOUZA, M. A. S.Rodrido DoriaSIMOEN, E.MARTINO, J. A.CLAEYS, C.Marcelo Antonio Pavanello2022-01-122022-01-122013-10-10DE SOUZA, M. A. S.; DORIA, R.; SIMOEN, E.; MARTINO, J. A.; CLAEYS, C.; PAVANELLO, M. A. Influence of substrate rotation on the low frequency noise of strained triple-gate MuGFETs. 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2013, Oct. 2013.https://repositorio.fei.edu.br/handle/FEI/4088Acesso RestritoArtigo de evento10.1109/S3S.2013.6716522