TREVISOLI, R.PAVANELLO, M. A.DORIA, R. T.DE SOUZA, M.BARRAUD, S.VINET, M.CASSE, M.REIMBOLD, G.FAYNOT, O.GHIBAUDO, G.2019-08-192019-08-192017TREVISOLI, R.; PAVANELLO, M. A.; DORIA, R. T.; DE SOUZA, M.; BARRAUD, S.; VINET, M.; CASSE, M.; REIMBOLD, G.; FAYNOT, O.; GHIBAUDO, G.. A New Method for Series Resistance Extraction of Nanometer MOSFETs. IEEE TRANSACTIONS ON ELECTRON DEVICES, v. 64, p. 2797-2803, 2017.0018-9383https://repositorio.fei.edu.br/handle/FEI/1290Acesso RestritoA New Method for Series Resistance Extraction of Nanometer MOSFETsArtigo10.1109/ted.2017.2704928