OLIVEIRA, A.B. DEBENEVENUT,I F.BENITES, L. A. C.RODRIGUES, G. S.KASTENSMIDT, F. L.ADDED N.AGUIAR, V. A. P.MEDINA, N. H.Marcilei Aparecida GuazzelliDEBARGE, C.2022-01-122022-01-122018-09-05OLIVEIRA, A.B. DE; BENEVENUT,I F.; BENITES, L. A. C.; RODRIGUES, G. S.; KASTENSMIDT, F. L.; ADDED N.; AGUIAR, V. A. P.; MEDINA, N. H.; SILVEIRA, M. A. G. DEBARGE, C. Analyzing the Influence of using Reconfiguration Memory Scrubber and Hardware Redundancy in a Radiation Hardened FPGA under Heavy Ions. 2018 18th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2018, sept. 2018.https://repositorio.fei.edu.br/handle/FEI/3776© 2018 IEEE.This work investigates the influence of using the built-in configuration memory scrubber and triple modular hardware redundancy in the cross section of a radiation-hardened SRAM-based FPGA from NanoXplore. Different designs versions are investigated under heavy ions for the occurrence of transient errors, failures, and timeouts. The calculated dynamic cross-sections are in agreement with the expected order of magnitude of radiation hardened SRAM-based FPGAs. Results show that the most reliable configuration is using DSPs for the operational logic and applying full design redundancy combined with scrubbing.Acesso RestritoArtigo de evento10.1109/RADECS45761.2018.9328683Fault-toleranceFPGAHeavy IonRad-HardRedundancyRHBD