DE SOUZA, R. N.Marcilei Aparecida GuazzelliSalvador Gimenez2022-01-122022-01-122014-09-05DE SOUZA, R. N.; GUAZZELLI; GIMENEZ, S. Improving MOSFETs radiation robustness by using the wave layout to boost analog ICs applications. 2014 29th Symposium on Microelectronics Technology and Devices: Chip in Aracaju, SBMicro 2014, Sept. 2014.https://repositorio.fei.edu.br/handle/FEI/4003This paper describes an experimental comparative study of the total ionizing dose (TID) effects between the Metal-Oxide-Semiconductor (MOS) Field Effect Transistors (MOSFET) manufactured with the Wave (S gate geometry) and the standard layouts (CnM). Because of the special characteristic of the bird's beaks regions of the Wave MOSFET (WnM), this innovative layout proposal for transistors is able to increase the devices TID hardness for analog integrated circuits (IC) applications in terms of the unity voltage gain frequency (fT) without causing any additional cost to the Complementary MOS (CMOS) manufacturing process.Acesso RestritoArtigo de evento10.1109/SBMicro.2014.6940117analog circuitsradiation hardness by designTIDtotal ionizing doseunit voltage gain frequencyWave layout