Fin shape influence on the analog performance of standard and strained MuGFETs

BÜHLER, Rudolf TheoderichMARTINO, J. AAGOPIAN, P. G. D.Renato GiacominiSIMOEN, E.CLAEYS, C.2022-01-122022-01-122010-10-14BÜHLER, R. T.; MARTINO, J. A; AGOPIAN, P. G. D.; GIACOMINI, R.; SIMOEN, E.; CLAEYS, C. Fin shape influence on the analog performance of standard and strained MuGFETs. Proceedings - IEEE International SOI Conference, Oct. 2010.https://repositorio.fei.edu.br/handle/FEI/4221Acesso RestritoFin shape influence on the analog performance of standard and strained MuGFETsArtigo de evento10.1109/SOI.2010.5641387