PRATES, R. R.BARRAUD, S.CASSE, M.VINET, M.FAYNOT, O.Marcelo Antonio Pavanello2022-11-012022-11-012022-08-22PRATES, R. R.; BARRAUD, S.; CASSE, M.; VINET, M.; FAYNOT, O.; PAVANELLO, M. A. Experimental Comparison of Junctionless and Inversion-Mode Nanowire MOSFETs Electrical Properties at High Temperatures. 36th Symposium on Microelectronics Technology, SBMICRO 2022 - Proceedings, aug. 2022.https://repositorio.fei.edu.br/handle/FEI/4625© 2022 IEEE.This work aims to present the electrical properties of junctionless and inversion-mode nanowires MOSFETs in the temperature range from 300 K to 580 K. Devices with different fin widths are compared. The comparison is performed using experimental data looking for some of the fundamental electrical parameters of these transistors such as threshold voltage, inverse subthreshold slope, current, and carrier mobility over the temperature.Acesso RestritoArtigo de evento10.1109/SBMICRO55822.2022.9881002electrical characteristicsinversion-modejunctionlesstemperature