Browsing by Author PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO
Showing results 1 to 5 of 5
| Issue Date | Title | Author(s) |
| 2012 | An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices | Trevisoli, Renan Doria; CLAEYS, Cor; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO; MARTINO, J. A.; SIMOEN, Eddy |
| 2013 | Analysis of the leakage current in junctionless nanowire transistors | SOUZA, Michelly de; TREVISOLI, Renan D.; DORIA, Rodrigo Trevisoli; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO |
| 2012 | Impact of the Series Resistance in the I-V Characteristics of Junctionless Nanowire Transistor and its Dependence on the Temperature | DORIA, Rodrigo Trevisoli; TREVISOLI, Renan D.; SOUZA, Michelly de; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO |
| 2007 | Low temperature influence on the uniaxially strained FD SOI nMOSFETs behavior | SOUZA, Michelly de; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO; MARTINO, João Antonio; SIMOEN, Eddy; CLAEYS, Cor |
| 2013 | Low-frequency noise of n-type triple gate FinFETs fabricated on standard and 45° rotated substrates | Doria, Rodrigo Trevisoli; MARTINO, J. A.; SIMOEN, Eddy; CLAEYS, Cor; PAVANELLO, Marcelo A.;PAVANELLO, M. A.;PAVANELLO, M.;PAVANELLO, M.A.;PAVANELLO, MARCELO;ANTONIO PAVANELLO, MARCELO |
