Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1055
Title: Extraction of the Oxide Charges at the Silicon Substrate Interface in Silicon-On-Insulator MOSFET's
Authors: PAVANELLO, Marcelo A.
MARTINO, João Antonio
Issue Date: 1999
Journal: Solid-State Electronics
ISSN: 0038-1101
Citation: PAVANELLO, Marcelo A.; MARTINO, João Antonio. Extraction of the Oxide Charges at the Silicon Substrate Interface in Silicon-On-Insulator MOSFET's. Solid-State Electronics, v. 41, n. 1, p. 2039-2046, 1999.
Access Type: Acesso Aberto
DOI: 10.1016/S0038-1101(99)00178-1
URI: https://repositorio.fei.edu.br/handle/FEI/1055
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