Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1147
Title: Extraction of the Oxide Charge Density at Front and Back Interfaces of SOI nMOSFETs Devices
Authors: NICOLETT, A. S.
MARTINO, João Antonio
SIMOEN, E.
CLAYES, C.
Issue Date: 2002
Journal: Solid-State Electronics
ISSN: 0038-1101
Citation: NICOLETT, A. S.; MARTINO, João Antonio; SIMOEN, E.; CLAYES, C.. Extraction of the Oxide Charge Density at Front and Back Interfaces of SOI nMOSFETs Devices. Solid-State Electronics, v. 46, p. 1381-1387, 2002.
Access Type: Acesso Aberto
URI: https://repositorio.fei.edu.br/handle/FEI/1147
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