Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/1336
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dc.contributor.authorRODRIGUES, Michele
dc.contributor.authorSONNENBERG, V.;SONNENBERG, V;Sonnenberg, Victor
dc.contributor.authorMARTINO, João Antonio
dc.date.accessioned2019-08-19T23:45:32Z-
dc.date.available2019-08-19T23:45:32Z-
dc.date.issued2008
dc.identifier.citationRODRIGUES, Michele; SONNENBERG, V.;SONNENBERG, V;Sonnenberg, Victor; MARTINO, João Antonio. Parameters Extraction from C-V Curves in Triple-Gate FinFET. JICS. Journal of Integrated Circuits and Systems (Ed. Português), v. 3, n. 2, p. 77-81, 2008.
dc.identifier.issn1807-1953
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/1336-
dc.relation.ispartofJICS. Journal of Integrated Circuits and Systems (Ed. Português)
dc.rightsAcesso Restrito
dc.titleParameters Extraction from C-V Curves in Triple-Gate FinFETpt_BR
dc.typeArtigopt_BR
dc.description.volume3
dc.description.issuenumber2
dc.description.firstpage77
dc.description.lastpage81
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