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Issue DateTitleAuthor(s)
2015Microstructure development of HfOx thin filmsCHINAGLIA, ELIANE F.; AVANCI, LUIS H.
2015The Influence of Back Gate Bias on the OCTO SOI MOSFET?s Response to X-ray RadiationDE SOUZA FINO, LEONARDO NAVARENHO; Gimenez, S. P.; RENAUX, C.; FLANDRE, DENIS; GUAZZELLI DA SILVEIRA, MARCILEI APARECIDA
2015Mitigating MOSFET Radiation Effects by Using the Wave Layout in Analog ICs ApplicationsSOUZA, R. N.; GUAZZELLI DA SILVEIRA, MARCILEI APARECIDA; GIMENEZ, S. P.
2015Distribuição de Potássio em Cana-de-AçúcarSILVEIRA, MARCILEI APARECIDA GUAZZELLI; MEDINA, Nilberto Heder
2015A New Test Environment Approach to SEE Detection in MOSFETsLuis Eduardo Seixas; SILVEIRA, M. A. G.; Guazzelli, Marcilei A.; Nilberto Medina; AGUIAR, V.A.P.; Nemitala Added; GIMENEZ, S. P.
2015Natural Radiation in Byproducts of the Production of Phosphoric AcidSILVEIRA, MARCILEI APARECIDA GUAZZELLI; CARDOSO, L. L.; MEDINA, N. H.
2015A commercial off-the-shelf pMOS transistor as X-ray and heavy ion detectorSilveira M.A.G.; Melo M.A.A.; Aguiar V.A.P.; Rallo A.; Santos R.B.B.; Medina N.H.; Added N.; Seixas L.E.; Leite F.G.; Cunha F.G.; Cirne K.H.; Giacomini R.; de OLIVEIRA J.A.
2015Metal-insulator transition in Nd1-xEuxNiO3: Entropy change and electronic delocalizationJardim R.F.; Barbeta V.B.; Andrade S.; Escote M.T.; Cordero F.; Torikachvili M.S.
2015Boosting the total ionizing dose tolerance of digital switches by using OCTO SOI MOSFETDe Souza Fino L.N.; Davini Neto E.; Da Silveira M.A.G.; Renaux C.; Flandre D.; Gimenez S.P.
2015Using the wave layout style to boost the digital ICs electrical performance in the radioactive environmentNavarenho-De-Souza R.; Silveira M.A.G.; Gimenez S.P.