(2019) ZAHN, G S; GENEZINI, F A; MORALLES, M; SIQUEIRA, P T D; MEDINA, N H; AGUIAR, V A P; MACCHIONE, E L A; ADDED, N; GUAZZELLI, Marcilei Aparecida
In this work, we present a facility to study errors in digital devices exposed to thermal neutrons from a beam hole in the IEA-R1 nuclear reactor, as well as the long-lived isotopes produced in the irradiation of digital electronic devices under a slow neutron field. Preliminary results obtained with the analysis of a 28nm SRAM-based Xilinx Zynq-7000 FPGA are presented.