Engenharia Química

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https://repositorio.fei.edu.br/handle/FEI/25

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Navegando Engenharia Química por Autor "ADDED, NEMITALA"

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    Artigo
    Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits
    (2019-07-26) GOERL, ROGER; VILLA, PAULO; VARGAS, FABIAN L.; MARCON, CÉSAR A.; MEDINA, NILBERTO H.; ADDED, NEMITALA; GUAZZELLI, Marcilei Aparecida
    International standards have been proposed and used to test Integrated Circuits (ICs) for Total-Ionizing Dose (TID) and Single-Event Upset (SEU) as well as for Electromagnetic Interference (EMI). Nevertheless, these standards are separately applied to the IC or electronic system, one after the other, and do not take into account the combined effects of these types of radiation may take over the ICs. In more detail, there is no standard that rules combined tests for TID, SEU and EMI. This paper aims to fulfill this lack of product quality information and proposes a new methodology to improve the reliability of ICs by performing combined tests for TID, SEU and EMI. We also present recent experimental results from combined measurements that we performed on a commercial FPGA IC widely used in critical embedded applications such as aerospace and automotive. Such results strongly suggest that the effects of radiation are not negligible and should be taken into account if one intends to design reliable embedded systems.
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    Artigo
    Evaluating Soft-Core RISC-V processor in SRAM-based FPGA under radiation effects
    (2020) OLIVEIRA, ÁDRIA B. DE; TAMBARA, LUCAS A.; BENEVENUTI, FABIO; BENITES, LUIS A. C.; ADDED, NEMITALA; AGUIAR, VITOR A. P.; MEDINA, NILBERTO H.; GUAZZELLI, Marcilei Aparecida; KASTENSMIDT, FERNANDA L.
    Abstract— This article evaluates the RISC-V Rocket processor embedded in a Commercial Off-The-Shelf (COTS) SRAM-based field-programmable gate array (FPGA) under heavy-ionsinduced faults and emulation fault injection. We also analyze the efficiency of using mitigation techniques based on hardware redundancy and scrubbing. Results demonstrated an improvement of 3× in the cross section when scrubbing and coarse grain triple modular redundancy are used. The Rocket processor presented analogous sensitivity to radiation effects as the state-ofthe-art soft processors. Due to the complexity of the system-onchip, not only the Rocket core but also its peripherals should be protected with proper solutions. Such solutions should address the specific vulnerabilities of each component to improve the overall system reliability while maintaining the trade-off with performance