Engenharia Elétrica
URI permanente desta comunidadehttps://repositorio.fei.edu.br/handle/FEI/21
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3 resultados
Resultados da Pesquisa
- Variability Modeling in Triple-Gate Junctionless Nanowire Transistors(2022-01-05) TREVISOLI, R.; Marcelo Antonio Pavanello; Rodrigo Doria; CAPOVILLA, C.E.; BARRAUD, S.; Michelly De SouzaIEEEThis work aims at proposing an analytical model for the variability of the threshold voltage and drain current in junctionless nanowire transistors. The model is continuous in all operation regions and has been validated through Monte Carlo simulations using a physically based drain current model and 3-D numerical simulations. A discussion about the influences of each variability source based on the proposed model is carried out. Finally, the modeled results are compared to the experimental data for a fully physical validation.
- Back bias impact on effective mobility of p-type nanowire SOI MOSFETs(2018-08-27) PAZ, B .C.; CASSE, M.; BARRAUD, S.; REIMBOLD, G.; VINET, M.; FAYNOT, O.; Marcelo Antonio PavanelloIn this work we investigated the impact of back bias on the effective mobility of p-type Ω-gate nanowire SOI MOSFETs. Evaluation is performed through both measurements and 3D numerical simulations. Electrostatic potential, electric field and holes density are studied through simulations to explain transconductance degradation with back bias increase. Holes mobility linear dependence on back bias is found to be related to the inversion channel density and its position along the silicon thickness. Besides, this work also sheds light on the dependence of the drain current in vertically stacked NW with back bias, as its behavior is determined by the bottom Ω-gate level.
- Influence of interface traps density and temperature variation on the NBTI effect in p-Type junctionless nanowire transistors(2021-12-05) GRAZIANO, N.; COSTA, F. J.; TREVISOLI, R.; BARRAUD, S.; Rodrigo Doria© 2021 Elsevier LtdThis paper deals with the behavior of degradation by NBTI effect in pMOS junctionless nanowire transistors (JNTs). The analysis has been performed through measurements followed by 3D numerical simulations and has shown that the increase in the oxygen precursors density close to the interface leads to the reduction of the saturation in the NBTI effect when the devices operate in partial depletion regime. Such effect can be associated to the change in the flatband voltage to more negative values as well as the threshold voltage with the increase in the precursor density. In the sequence of the work, it was shown that, as the operation temperature rises, there is an increase in the degradation of the threshold voltage due to NBTI, which is more pronounced for larger gate voltages. It was concluded that this effect could be associated to the increase in the recombination rate with the temperature, which enables the occupation of a larger amount of traps.