Evaluating Soft-Core RISC-V processor in SRAM-based FPGA under radiation effects

dc.contributor.authorOLIVEIRA, ÁDRIA B. DE
dc.contributor.authorTAMBARA, LUCAS A.
dc.contributor.authorBENEVENUTI, FABIO
dc.contributor.authorBENITES, LUIS A. C.
dc.contributor.authorADDED, NEMITALA
dc.contributor.authorAGUIAR, VITOR A. P.
dc.contributor.authorMEDINA, NILBERTO H.
dc.contributor.authorGUAZZELLI, Marcilei Aparecida
dc.contributor.authorKASTENSMIDT, FERNANDA L.
dc.date.issued2020
dc.description.abstractAbstract— This article evaluates the RISC-V Rocket processor embedded in a Commercial Off-The-Shelf (COTS) SRAM-based field-programmable gate array (FPGA) under heavy-ionsinduced faults and emulation fault injection. We also analyze the efficiency of using mitigation techniques based on hardware redundancy and scrubbing. Results demonstrated an improvement of 3× in the cross section when scrubbing and coarse grain triple modular redundancy are used. The Rocket processor presented analogous sensitivity to radiation effects as the state-ofthe-art soft processors. Due to the complexity of the system-onchip, not only the Rocket core but also its peripherals should be protected with proper solutions. Such solutions should address the specific vulnerabilities of each component to improve the overall system reliability while maintaining the trade-off with performance
dc.description.firstpage1503
dc.description.issuenumber7
dc.description.lastpage1510
dc.description.volume67
dc.identifier.citationOLIVEIRA, ÁDRIA B. DE; TAMBARA, LUCAS A.; BENEVENUTI, FABIO; BENITES, LUIS A. C.; ADDED, NEMITALA; AGUIAR, VITOR A. P.; MEDINA, NILBERTO H.; GUAZZELLI, M. A.; KASTENSMIDT, FERNANDA L. Evaluating Soft-Core RISC-V processor in SRAM-based FPGA under radiation effects. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, n. 1, p. 1-1, 2020.
dc.identifier.doi10.1109/TNS.2020.2995729
dc.identifier.issn0018-9499
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3283
dc.relation.ispartofIEEE TRANSACTIONS ON NUCLEAR SCIENCE
dc.rightsAcesso Restrito
dc.subjectOff-The-Shelf (COTS)
dc.subjectSRAM-based field-programmable gate array (FPGA
dc.subjectfault injection (FI)
dc.subjectfault tolerance
dc.subjectheavy ion
dc.subjectRISC-V
dc.subjectrocket
dc.titleEvaluating Soft-Core RISC-V processor in SRAM-based FPGA under radiation effectspt_BR
dc.typeArtigopt_BR
fei.scopus.citations25
fei.scopus.eid2-s2.0-85088865632
fei.scopus.updated2023-11-01
fei.source.urlhttps://ieeexplore.ieee.org/document/9096401
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