Neutron radiation effects on an electronic system on module

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dc.contributor.authorLO PRESTI, D.
dc.contributor.authorMEDINA, N. H.
dc.contributor.authorMORALLES, M. M.
dc.contributor.authorAGUIAR, V. AP
dc.contributor.authorOLIVEIRA, J. R. B.
dc.contributor.authorADDED, N.
dc.contributor.authorMACCHIONE, E. L. A.
dc.contributor.authorSIQUEIRA, P. DE T. D.
dc.contributor.authorZAHN, G. Z.
dc.contributor.authorGENEZINI, F.
dc.contributor.authorBONANNO, D.
dc.contributor.authorGALLO, G.
dc.contributor.authorRUSSO, S.
dc.contributor.authorSGOUROS, O.
dc.contributor.authorMUOIO, A.
dc.contributor.authorPANDOLA, L.
dc.contributor.authorCAPPUZZELLO, F.
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-7110-7241
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-7110-7241
dc.date.issued2020-08-13
dc.description.abstractThe NUMEN (NUclear Matrix Elements for Neutrinoless double beta decay) project was recently proposed with the aim to investigate the nuclear response to Double Charge Exchange reactions for all the isotopes explored by present and future studies of 0νββ decay. The expected level of radiation in the NUMEN experiment imposes severe limitations on the average lifetime of the electronic devices. During the experiments, it is expected that the electronic devices will be exposed to about 105 neutrons/cm2/s according to FLUKA simulations. This paper investigates the reliability of a System On Module (SOM) under neutron radiation. The tests were performed using thermal, epithermal, and fast neutrons produced by the Instituto de Pesquisas Energéticas e Nucleares 4.5 MW Nuclear Research Reactor. The results show that the National Instruments SOM is robust to neutron radiation for the proposed applications in the NUMEN project.
dc.description.firstpage083301
dc.description.issuenumber8
dc.description.lastpage083301-5
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipFinanciadora de Estudos e Projetos (FINEP)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.volume91
dc.identifier.citationLO PRESTI, D.; M., N. H.; GUAZZELLI, M. A.; MORALLES, M.; AGUIAR, V. A. P.; OLIVEIRA, J. R. B.; ADDE, N. ; MACCHIONE, E. L. A.; SIQUEIRA, P. DE T. D.; ZAHN, G. Z.; GENEZINI, F.; BONANNO, D.; GALLO, G.; RUSSO, S.; SGOUROS, O.; MUOIO, A.; PANDOLA, L.; CAPPUZZELLO, F. Neutron radiation effects on an electronic system on module. REVIEW OF SCIENTIFIC INSTRUMENTS, v. 91, n. 8, p. 083301-083301-5, 2020.pt_BR
dc.identifier.doi10.1063/5.0010968pt_BR
dc.identifier.issn0034-6748
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3286
dc.relation.ispartofREVIEW OF SCIENTIFIC INSTRUMENTS
dc.rightsAcesso Restrito
dc.titleNeutron radiation effects on an electronic system on modulept_BR
dc.typeArtigopt_BR
fei.scopus.citations6
fei.scopus.eid2-s2.0-85089950810
fei.scopus.updated2024-03-04
fei.source.urlhttps://aip.scitation.org/doi/10.1063/5.0010968
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