Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits

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dc.contributor.authorGOERL, ROGER
dc.contributor.authorVILLA, PAULO
dc.contributor.authorVARGAS, FABIAN L.
dc.contributor.authorMARCON, CÉSAR A.
dc.contributor.authorMEDINA, NILBERTO H.
dc.contributor.authorADDED, NEMITALA
dc.contributor.authorGUAZZELLI, Marcilei Aparecida
dc.date.issued2019-07-26
dc.description.abstractInternational standards have been proposed and used to test Integrated Circuits (ICs) for Total-Ionizing Dose (TID) and Single-Event Upset (SEU) as well as for Electromagnetic Interference (EMI). Nevertheless, these standards are separately applied to the IC or electronic system, one after the other, and do not take into account the combined effects of these types of radiation may take over the ICs. In more detail, there is no standard that rules combined tests for TID, SEU and EMI. This paper aims to fulfill this lack of product quality information and proposes a new methodology to improve the reliability of ICs by performing combined tests for TID, SEU and EMI. We also present recent experimental results from combined measurements that we performed on a commercial FPGA IC widely used in critical embedded applications such as aerospace and automotive. Such results strongly suggest that the effects of radiation are not negligible and should be taken into account if one intends to design reliable embedded systems.
dc.description.firstpage113341
dc.description.volume100–101
dc.identifier.citationGOERL, ROGER; VILLA, PAULO; VARGAS, FABIAN L.; MARCON, CÉSAR A.; MEDINA, NILBERTO H.; ADDED, NEMITALA; GUAZZELLI, M. A. Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits. MICROELECTRONICS RELIABILITY, v. 100, p. 113341, 2019.
dc.identifier.doi10.1016/j.microrel.2019.06.033
dc.identifier.issn0026-2714
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3280
dc.relation.ispartofMICROELECTRONICS RELIABILITY
dc.rightsAcesso Restrito
dc.subjectTotal-ionizing dose (TID) radiation
dc.subjectSingle-event upset (SEU) radiation
dc.subjectElectromagnetic interference (EMI)
dc.subjectTransient fault
dc.subjectCombined laboratory test strategy
dc.titleCombined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuitspt_BR
dc.typeArtigopt_BR
fei.source.urlwww.sciencedirect.com/science/article/pii/S0026271419305098
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