Reliability Evaluation of Voters for Fault Tolerant Approximate Systems

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dc.contributor.authorBALEN, T. R.
dc.contributor.authorGONZALEZ, C. J.
dc.contributor.authorOLIVEIRA, I. F. V.
dc.contributor.authorSCHVITTZ, R. B.
dc.contributor.authorADDED, N.
dc.contributor.authorMACCHIONE, E. L. A.
dc.contributor.authorAGUIAR, V. A. P.
dc.contributor.authorMarcilei Aparecida Guazzelli
dc.contributor.authorMEDINA, N. H.
dc.contributor.authorBUTZEN, P. F.
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-7110-7241
dc.date.accessioned2022-03-01T06:05:16Z
dc.date.available2022-03-01T06:05:16Z
dc.date.issued2021-10-27
dc.description.abstractThis work presents a study on the reliability of voters for approximate fault tolerant systems in the context of single event effects. A first case study analyses different topologies of single-bit majority voters for logic circuits by means of fault injection by simulation. In these simulations a previous analysis is performed identifying the critical diffusion areas of the physical implementation according to the voter input vector. Additionally, as second case study, practical heavy ion experiments on different architectures of software-based approximate voters for mixed-signal applications are also presented, and the cross section of each voter is evaluated. The system comprising the voter was irradiated in two distinct experiments with an 16O ion beam, producing an effective $LET$ at the active region of 5.5 MeV/mg/cm2. Results of both case-studies allow identifying the most tolerant voter architectures (among the studied ones) for approximate computing applications under single event effects.
dc.identifier.citationBALEN, T. R.; GONZALEZ, C. J.; OLIVEIRA, I. F. V.; SCHVITTZ, R. B.; ADDED, N.; MACCHIONE, E. L. A.; AGUIAR, V. A. P.; GUAZZELLI, M. A.; MEDINA, N. H.;BUTZEN, P. F. Reliability Evaluation of Voters for Fault Tolerant Approximate Systems, 2021 IEEE 22nd Latin American Test Symposium, LATS 2021.
dc.identifier.doi10.1109/LATS53581.2021.9651736
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/4427
dc.relation.ispartof2021 IEEE 22nd Latin American Test Symposium, LATS 2021
dc.rightsAcesso Restrito
dc.subject.otherlanguageApproximate Computing
dc.subject.otherlanguageATMR
dc.subject.otherlanguageRadiation Effects
dc.subject.otherlanguageReliability
dc.subject.otherlanguageTMR
dc.titleReliability Evaluation of Voters for Fault Tolerant Approximate Systems
dc.typeArtigo de evento
fei.scopus.citations1
fei.scopus.eid2-s2.0-85124356117
fei.scopus.subjectApproximate computing
fei.scopus.subjectATMR
fei.scopus.subjectCase study analysis
fei.scopus.subjectCase-studies
fei.scopus.subjectFault- tolerant systems
fei.scopus.subjectFault-tolerant
fei.scopus.subjectReliability Evaluation
fei.scopus.subjectSingle event effects
fei.scopus.subjectSingle-bit
fei.scopus.subjectTMR
fei.scopus.updated2024-07-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85124356117&origin=inward
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