Reliability calculation with respect to functional failures induced by radiation in TMR arm cortex-M0 soft-core embedded into SRAM-based FPGA

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dc.contributor.authorBenites L.A.C.
dc.contributor.authorBenevenuti F.
dc.contributor.authorDe Oliveira A.B.
dc.contributor.authorKastensmidt F.L.
dc.contributor.authorAdded N.
dc.contributor.authorAguiar V.A.P.
dc.contributor.authorMedina N.H.
dc.contributor.authorGuazzelli M.A.
dc.date.accessioned2019-08-19T23:47:21Z
dc.date.available2019-08-19T23:47:21Z
dc.date.issued2019
dc.description.abstract© 2019 IEEE.This paper presents comparative results from fault injection (FI) and heavy ions accelerated irradiation on a Xilinx 7 series static RAM (SRAM)-based field-programmable gate array (FPGA) for a soft-core microprocessor mitigated by triple modular redundancy (TMR) with different levels of granularity. The Arm Cortex-M0 soft-core processor executing two software applications is employed as a case study. The TMR implementation is automatically generated from synthesized netlist and includes coarse and fine grain variants. Apart from the TMR mitigation, the configuration memory scrubbing is used as implemented by the engine natively available on Xilinx 7 series FPGAs. Experiments with FI and heavy ions allow analyzing the effectiveness of the automated TMR mitigation combined with memory scrubbing and also to analyze the consistency of reliability metrics from FI and heavy ions. The dynamic cross section of the design was improved up to 4.5 times according to the implemented TMR granularity and when associated with the configuration memory scrubbing.
dc.description.firstpage1433
dc.description.issuenumber7
dc.description.lastpage1440
dc.description.volume66
dc.identifier.citationBENITES, LUIS A. C.; BENEVENUTI, FABIO; DE OLIVEIRA, ADRIA B.; KASTENSMIDT, FERNANDA L.; ADDED, NEMITALA; AGUIAR, VITOR A. P.; MEDINA, NILBERTO H.; Guazzelli, Marcilei A.. Reliability Calculation with Respect of Functional Failures Induced by Radiation in TMR ARM Cortex-M0 Soft-core Embedded into SRAM-based FPGA. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v. 66, p. 1433/18832009-1440, 2019.
dc.identifier.doi10.1109/TNS.2019.2921796
dc.identifier.issn1558-1578
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/1481
dc.relation.ispartofIEEE Transactions on Nuclear Science
dc.rightsAcesso Restrito
dc.subject.otherlanguageArm microprocessor
dc.subject.otherlanguagefault injection (FI)
dc.subject.otherlanguagefield-programmable gate array (FPGA)
dc.subject.otherlanguageheavy ion
dc.subject.otherlanguagereliability
dc.subject.otherlanguagesoft error
dc.subject.otherlanguagesoft processor
dc.subject.otherlanguagetriple modular redundancy (TMR)
dc.titleReliability calculation with respect to functional failures induced by radiation in TMR arm cortex-M0 soft-core embedded into SRAM-based FPGA
dc.typeArtigo
fei.scopus.citations19
fei.scopus.eid2-s2.0-85069792386
fei.scopus.subjectAutomatically generated
fei.scopus.subjectFault injection
fei.scopus.subjectReliability calculation
fei.scopus.subjectSoft error
fei.scopus.subjectSoft processors
fei.scopus.subjectSoft-core processors
fei.scopus.subjectSoftware applications
fei.scopus.subjectTriple modular redundancy
fei.scopus.updated2024-03-04
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85069792386&origin=inward
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