Parameter extraction in quadratic exponential junction model with series resistance using global lateral fitting

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dc.contributor.authorLUGO-MUNOZ, D.
dc.contributor.authorMichelly De Souza
dc.contributor.authorMarcelo Antonio Pavanello
dc.contributor.authorFLANDRE, D.
dc.contributor.authorMUCI, J.
dc.contributor.authorORTI-CONDE, A.
dc.contributor.authorGARCIA-SANCHEZ, F. J.
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1361-3650
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-6472-4807
dc.date.accessioned2022-01-12T22:03:49Z
dc.date.available2022-01-12T22:03:49Z
dc.date.issued2010-01-05
dc.description.abstractA global lateral fitting procedure is proposed to extract the parameters of quadratic double exponential junction models in the presence of parasitic series resistance. Error analysis of the extracted parameters values within a large representative family of synthetic data indicate excellent match between the extracted values and a wide range of the original given model parameters. The procedure was also tested on real data to extract the model parameters of an experimental Silicon PIN diode measured at cryogenic temperature. ©The Electrochemical Society.
dc.description.firstpage369
dc.description.issuenumber1
dc.description.lastpage376
dc.description.volume31
dc.identifier.citationLUGO-MUNOZ, D.; DE SOUZA, M.; PAVANELLO, M. A.; FLANDRE, D.; MUCI, J.; ORTI-CONDE, A.; GARCIA-SANCHEZ, F. J. Parameter extraction in quadratic exponential junction model with series resistance using global lateral fitting. ECS Transactions, v. 31, n. 1, p. 369-376, Jan. 2010.
dc.identifier.doi10.1149/1.3474181
dc.identifier.issn1938-5862
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/4229
dc.relation.ispartofECS Transactions
dc.rightsAcesso Restrito
dc.titleParameter extraction in quadratic exponential junction model with series resistance using global lateral fitting
dc.typeArtigo de evento
fei.scopus.citations8
fei.scopus.eid2-s2.0-79952482530
fei.scopus.subjectCryogenic temperatures
fei.scopus.subjectFitting procedure
fei.scopus.subjectModel parameters
fei.scopus.subjectParasitic series resistance
fei.scopus.subjectSeries resistances
fei.scopus.subjectSilicon PIN diode
fei.scopus.subjectSynthetic data
fei.scopus.updated2024-07-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=79952482530&origin=inward
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