VI-Based Measurement System Focusing on Space Applications

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dc.contributor.authorSeixas L.E.
dc.contributor.authorFinco S.
dc.contributor.authorGimenez S.P.
dc.date.accessioned2019-08-19T23:45:29Z
dc.date.available2019-08-19T23:45:29Z
dc.date.issued2017
dc.description.abstract© 2017, Springer Science+Business Media New York.This article describes in detail a custom, high-performance, compact, flexible and reconfigurable test equipment. This measurement system is able to perform, locally or remotely, the electrical characterization of semiconductor devices and integrated circuits (ICs) under ionizing irradiation tests. This measurement platform can be managed remotely through serial, Local Network Area (LAN) link, allowing the electrical characterization of these devices in harsh test environments. Using this customized test measurement system, we were capable to reduce total test time by 1/3 in our TID test application.
dc.description.firstpage267
dc.description.issuenumber2
dc.description.lastpage274
dc.description.volume33
dc.identifier.citationLuis Eduardo Seixas; FINCO, S.; GIMENEZ, S. P.. VI-Based Measurement System Focusing on Space Applications. Journal of Electronic Testing, v. 1, n. 1, p. 1-8, 2017.
dc.identifier.doi10.1007/s10836-017-5651-3
dc.identifier.issn1573-0727
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/1311
dc.relation.ispartofJournal of Electronic Testing: Theory and Applications (JETTA)
dc.rightsAcesso Restrito
dc.subject.otherlanguageIC electrical characterization
dc.subject.otherlanguagePXI test equipment
dc.subject.otherlanguageRadiations effects on ICs
dc.titleVI-Based Measurement System Focusing on Space Applications
dc.typeArtigo
fei.scopus.citations2
fei.scopus.eid2-s2.0-85014544394
fei.scopus.subjectElectrical characterization
fei.scopus.subjectIntegrated circuits (ICs)
fei.scopus.subjectIonizing irradiation
fei.scopus.subjectMeasurement system
fei.scopus.subjectTest applications
fei.scopus.subjectTest Environment
fei.scopus.subjectTest equipments
fei.scopus.subjectTest measurements
fei.scopus.updated2024-03-04
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85014544394&origin=inward
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