Influence of the intrinsic length on the behavior of PIN diodes fabricated on SOI substrates working as solar cells
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Tipo de produção
Artigo de evento
Data de publicação
2018-10-26
Texto completo (DOI)
Periódico
33rd Symposium on Microelectronics Technology and Devices, SBMicro 2018
Editor
Texto completo na Scopus
Citações na Scopus
2
Autores
SILVA, F.
Rodrigo Doria
Michelly De Souza
Orientadores
Resumo
© 2018 IEEE.This work evaluates the influence of the intrinsic region length on the behavior of PIN diodes fabricated in the substrate of SOI wafers, operating as solar cells. The analysis has been performed in terms of efficiency and fill factor, fundamental parameters for the solar cell characterization. The studied cell has shown efficiency of about 7% to 8% and fill factor with average about 80%. Originally, ungated PIN devices have been considered in TCAD simulations. In the sequence, a gate has been placed over the intrinsic region of simulated devices and different biases (0V and 5V) were applied to compare the results with the ungated ones. Lastly, different operation temperatures have been applied into simulations, aiming to achieve results closer to real operation conditions.
Citação
SILVA, F.; DORIA. R.; DE SOUZA, M. Influence of the intrinsic length on the behavior of PIN diodes fabricated on SOI substrates working as solar cells. 33rd Symposium on Microelectronics Technology and Devices, SBMicro 2018, oct. 2018.
Palavras-chave
Keywords
PIN Diodes; SOI Technology; Solar Cells
Assuntos Scopus
Fill factor; Operation conditions; Operation temperature; PiN diode; SOI substrates; SOI technology; Solar cell characterization; TCAD simulation