Repositório do Conhecimento Institucional do Centro Universitário FEI
 

Influence of the intrinsic length on the behavior of PIN diodes fabricated on SOI substrates working as solar cells

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Tipo de produção

Artigo de evento

Data de publicação

2018-10-26

Texto completo (DOI)

Periódico

33rd Symposium on Microelectronics Technology and Devices, SBMicro 2018

Editor

Citações na Scopus

2

Autores

SILVA, F.
Rodrigo Doria
Michelly De Souza

Orientadores

Resumo

© 2018 IEEE.This work evaluates the influence of the intrinsic region length on the behavior of PIN diodes fabricated in the substrate of SOI wafers, operating as solar cells. The analysis has been performed in terms of efficiency and fill factor, fundamental parameters for the solar cell characterization. The studied cell has shown efficiency of about 7% to 8% and fill factor with average about 80%. Originally, ungated PIN devices have been considered in TCAD simulations. In the sequence, a gate has been placed over the intrinsic region of simulated devices and different biases (0V and 5V) were applied to compare the results with the ungated ones. Lastly, different operation temperatures have been applied into simulations, aiming to achieve results closer to real operation conditions.

Citação

SILVA, F.; DORIA. R.; DE SOUZA, M. Influence of the intrinsic length on the behavior of PIN diodes fabricated on SOI substrates working as solar cells. 33rd Symposium on Microelectronics Technology and Devices, SBMicro 2018, oct. 2018.

Palavras-chave

Keywords

PIN Diodes; SOI Technology; Solar Cells

Assuntos Scopus

Fill factor; Operation conditions; Operation temperature; PiN diode; SOI substrates; SOI technology; Solar cell characterization; TCAD simulation

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