Testing a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions

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dc.contributor.authorGONZALEZ, C. J.
dc.contributor.authorMACHADO, D. N.
dc.contributor.authorVAZ, R. G.
dc.contributor.authorVILAS BOAS, A. C.
dc.contributor.authorGONLALEZ, O. L.
dc.contributor.authorPUCHNER, H.
dc.contributor.authorADDED, N.
dc.contributor.authorMACCHIONE, E. L. A.
dc.contributor.authorAGUIAR, V. A. P.
dc.contributor.authorKASTENSMIDT, F. L.
dc.contributor.authorMEDINA, N. H.
dc.contributor.authorMarcilei Aparecida Guazzelli
dc.contributor.authorBALEN, T. R.
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-7110-7241
dc.date.accessioned2022-06-01T06:05:30Z
dc.date.available2022-06-01T06:05:30Z
dc.date.issued2021-01-05
dc.description.abstract© 2021, Brazilian Microelectronics Society. All rights reserved.— This work presents results of three distinct radiation tests performed upon a fault tolerant data acquisition system comprising a design diversity redundancy technique. The first and second experiments are Total Ionizing Dose (TID) essays, comprising gamma and X-ray irradiations. The last experiment considers single event effects, in which two heavy ion irradiation campaigns are carried out. The case study system comprises three analog-to-digital converters and two software-based vot-ers, besides additional software and hardware resources used for controlling, monitoring and memory manage-ment. The applied Diversity Triple Modular Redundancy (DTMR) technique, comprises different levels of diversity (temporal and architectural). The circuit was designed in a programmable System-on-Chip (PSoC), fabricated in a 130nm CMOS technology process. Results show that the technique may increase the lifetime of the system under TID if comparing with a non-redundant implementation. Considering the heavy ions experiments the system was proved effective to tolerate 100% of the observed errors originated in the converters, while errors in the processing unit present a higher criticality. Critical errors occur-ring in one of the voters were also observed. A second heavy ion campaign was then carried out to investigate the voters reliability, comparing the the dynamic cross section of three different software-based voter schemes im-plemented in the considered PSoC.
dc.description.issuenumber3
dc.description.volume16
dc.identifier.citationGONZALEZ, C. J.; MACHADO, D. N.; VAZ, R. G.; VILAS BOAS, A. C.; GONLALEZ, O. L.; PUCHNER, H.; ADDED, N.; MACCHIONE, E. L. A.; AGUIAR, V. A. P.; KASTENSMIDT, F. L.; MEDINA, N. H.; GUAZZELLI, M. A.; BALEN, T. R. Testing a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions. Journal of Integrated Circuits and Systems, v. 16, n. 3, 2022.
dc.identifier.doi10.29292/jics.v16i3.567
dc.identifier.issn1872-0234
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/4509
dc.relation.ispartofJournal of Integrated Circuits and Systems
dc.rightsAcesso Aberto
dc.rights.licenseOpen Journal Systems "Este é um artigo publicado em acesso aberto sob uma licença de código aberto (GPL v2). Fonte: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85129557254&origin=inward. Disponível em: 08 Agosto de 2022.
dc.subject.otherlanguageAnalog-to-Digital Converters
dc.subject.otherlanguageDesign Diversity Redundancy
dc.subject.otherlanguageFault Tolerance
dc.subject.otherlanguageMixed-Signal
dc.subject.otherlanguageProgrammable device
dc.subject.otherlanguagePSoC
dc.subject.otherlanguageRadiation
dc.subject.otherlanguageSingle Events
dc.subject.otherlanguageSoft Errors
dc.titleTesting a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions
dc.typeArtigo
fei.scopus.citations0
fei.scopus.eid2-s2.0-85129557254
fei.scopus.updated2024-07-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85129557254&origin=inward
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