Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications

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dc.contributor.authorSilva T.F.
dc.contributor.authorRodrigues C.L.
dc.contributor.authorAdded N.
dc.contributor.authorRizzutto M.A.
dc.contributor.authorTabacniks M.H.
dc.contributor.authorMangiarotti A.
dc.contributor.authorCurado J.F.
dc.contributor.authorAguirre F.R.
dc.contributor.authorAguero N.F.
dc.contributor.authorAllegro P.R.P.
dc.contributor.authorCampos P.H.O.V.
dc.contributor.authorRestrepo J.M.
dc.contributor.authorTrindade G.F.
dc.contributor.authorAntonio M.R.
dc.contributor.authorAssis R.F.
dc.contributor.authorLeite A.R.
dc.date.accessioned2019-08-19T23:47:14Z
dc.date.available2019-08-19T23:47:14Z
dc.date.issued2018
dc.description.abstract© 2018 Elsevier B.V.The elemental mapping of large areas using ion beam techniques is a desired capability for several scientific communities, involved on topics ranging from geoscience to cultural heritage. Usually, the constraints for large-area mapping are not met in setups employing micro- and nano-probes implemented all over the world. A novel setup for mapping large sized samples in an external beam was recently built at the University of São Paulo employing a broad MeV-proton probe with sub-millimeter dimension, coupled to a high-precision large range XYZ robotic stage (60 cm range in all axis and precision of 5 μm ensured by optical sensors). An important issue on large area mapping is how to deal with the irregularities of the sample's surface, that may introduce artifacts in the images due to the variation of the measuring conditions. In our setup, we implemented an automatic system based on machine vision to correct the position of the sample to compensate for its surface irregularities. As an additional benefit, a 3D digital reconstruction of the scanned surface can also be obtained. Using this new and unique setup, we have produced large-area elemental maps of ceramics, stones, fossils, and other sort of samples.
dc.description.firstpage68
dc.description.lastpage77
dc.description.volume422
dc.identifier.citationSILVA, T.F.; ALLEGRO, P.R.P.; CAMPOS, P.H.O.V.; RESTREPO, J.M.; TRINDADE, G.F.; ANTONIO, M.R.; ASSIS, R.F.; LEITE, A.R.; RODRIGUES, C.L.; ADDED, N.; RIZZUTTO, M.A.; TABACNIKS, M.H.; MANGIAROTTI, A.; CURADO, J.F.; AGUIRRE, F.R.; AGUERO, N.F.. Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v. 422, p. 68-77, 2018.
dc.identifier.doi10.1016/j.nimb.2018.03.006
dc.identifier.issn0168-583X
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/1397
dc.relation.ispartofNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
dc.rightsAcesso Restrito
dc.subject.otherlanguageElemental mapping
dc.subject.otherlanguageExternal beam
dc.subject.otherlanguageIon beam analysis
dc.subject.otherlanguageLarge area
dc.titleElemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications
dc.typeArtigo
fei.scopus.citations11
fei.scopus.eid2-s2.0-85043333849
fei.scopus.subjectDigital reconstruction
fei.scopus.subjectElemental mapping
fei.scopus.subjectExternal beam
fei.scopus.subjectIon beam analysis
fei.scopus.subjectLarge area
fei.scopus.subjectMeasuring conditions
fei.scopus.subjectSub-millimeter resolutions
fei.scopus.subjectSurface irregularities
fei.scopus.updated2024-03-04
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85043333849&origin=inward
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