SOI PIN diodes for temperature sensing in harsh environment
| dc.contributor.author | RUE, B. | |
| dc.contributor.author | Michelly De Souza | |
| dc.contributor.author | Marcelo Antonio Pavanello | |
| dc.contributor.author | FLANDRE, D. | |
| dc.contributor.authorOrcid | https://orcid.org/0000-0003-1361-3650 | |
| dc.contributor.authorOrcid | https://orcid.org/0000-0001-6472-4807 | |
| dc.date.accessioned | 2023-08-26T23:49:59Z | |
| dc.date.available | 2023-08-26T23:49:59Z | |
| dc.date.issued | 2009-09-13 | |
| dc.description.abstract | We study the use of lateral SOI PIN diodes as thermometers in a large range of temperature from 100 K to 575 K and under radiations. These diodes indeed show very linear voltage vs temperature characteristics when biased with a constant current and can be successfully used in an integrated temperature sensor. The diodes are implemented in three SOI technologies: UCL 2μm process, Xfab1μm and OKI 0.15μm industrial processes. The OKI diode characteristics after neutron irradiation are also discussed. | |
| dc.description.firstpage | 64 | |
| dc.description.lastpage | 69 | |
| dc.identifier.citation | RUE, B.; DE SOUZA, M.; PAVANELLO, M. A.; FLANDRE, D. SOI PIN diodes for temperature sensing in harsh environment. Proceedings - 2009 IMAPS International Conference on High Temperature Electronics Network, HiTEN 2009, p. 64-69, sept. 2009. | |
| dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/5007 | |
| dc.relation.ispartof | Proceedings - 2009 IMAPS International Conference on High Temperature Electronics Network, HiTEN 2009 | |
| dc.rights | Acesso Restrito | |
| dc.subject.otherlanguage | High temperature | |
| dc.subject.otherlanguage | Irradiation | |
| dc.subject.otherlanguage | Low temperature | |
| dc.subject.otherlanguage | SOI PIN diode | |
| dc.subject.otherlanguage | Temperature sensor | |
| dc.title | SOI PIN diodes for temperature sensing in harsh environment | |
| dc.type | Artigo de evento | |
| fei.scopus.citations | 0 | |
| fei.scopus.eid | 2-s2.0-84876934708 | |
| fei.scopus.subject | Diode characteristics | |
| fei.scopus.subject | Harsh environment | |
| fei.scopus.subject | High temperature | |
| fei.scopus.subject | Industrial processs | |
| fei.scopus.subject | Low temperatures | |
| fei.scopus.subject | PiN diode | |
| fei.scopus.subject | Temperature characteristic | |
| fei.scopus.subject | Temperature sensing | |
| fei.scopus.updated | 2025-02-01 | |
| fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84876934708&origin=inward |