PIN sensor array response to heavy-ion particles in bulk and SOI technologies

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2017-09-01
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BÜHLER, Rudolf Theoderich
CANSIO, E. T.
PERIN, A. L.
NOVO, C. D.
Marcilei Aparecida Guazzelli
Renato Giacomini
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SBMicro 2017 - 32nd Symposium on Microelectronics Technology and Devices: Chip on the Sands, co-located Symposia: 30th SBCCI - Circuits and Systems Design, 2nd INSCIT - Electronic Instrumentation, 7th WCAS - IC Design Cases and 17th SForum - Undergraduate-Student Forum
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BÜHLER, R. T.; CANSIO, E. T.; PERIN, A. L.; NOVO, C. D.; GUAZZELLI, M. A.; GIACOMINI, R. PIN sensor array response to heavy-ion particles in bulk and SOI technologies. SBMicro 2017 - 32nd Symposium on Microelectronics Technology and Devices: Chip on the Sands, co-located Symposia: 30th SBCCI - Circuits and Systems Design, 2nd INSCIT - Electronic Instrumentation, 7th WCAS - IC Design Cases and 17th SForum - Undergraduate-Student Forum, Sept. 2017.
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© 2017 IEEE.The PIN sensor array in two technologies (bulk and SOI) is studied here, based on fabricated lateral PIN. Experimental data in non-radiation environment is used to adjust the models implemented in the numerical simulator that are latter used to evaluate the radiation analysis for heavy-ion particles. Near-Earth natural environment is composed of energetic protons, electrons, and heavy-ions coming from galactic cosmic ray and solar events. Radiation sensors come as a vital part to study and monitor energetic particles in radiation environments.

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