Modeling Quantum Confinement in Multi-Gate Transistors with Effective Potential
dc.contributor.author | SOARES, C. S. | |
dc.contributor.author | BAIKADI, P. K. R. | |
dc.contributor.author | ROSSETO, A. C. J. | |
dc.contributor.author | Marcelo Antonio Pavanello | |
dc.contributor.author | VASILESKA, D. | |
dc.contributor.author | WIRTH, G. I. | |
dc.contributor.authorOrcid | https://orcid.org/0000-0003-1361-3650 | |
dc.date.accessioned | 2022-11-01T06:04:28Z | |
dc.date.available | 2022-11-01T06:04:28Z | |
dc.date.issued | 2022 | |
dc.description.abstract | © 2022 IEEE.Particle-based Monte Carlo device simulators are an efficient tool to investigate the performance and reliability of transistors. The semiclassical theoretical model employed in the Monte Carlo device simulator is unsuccessful to describe some aspects of the multi-gate transistors that come from the quantum behavior of charge carriers. To take into consideration the space-quantization effects in these simulators, a quantum correction is necessary. We propose to include an effective potential in the Monte Carlo device simulator to address the wave-like behavior of electrons in n-type silicon FinFET and n-type silicon nanowire transistors. The effective potential has a unique parameter, which can be adjusted to find a line density using an Effective Potential-Poisson solver that matches with the line density calculated using a Schrodinger-Poisson solver. We demonstrated that using the effective potential model, the effect of the electron confinement is well described. | |
dc.identifier.citation | SOARES, C. S.; BAIKADI, P. K. R.; ROSSETO, A. C. J.; PAVANELLO, M. A.; VASILESKA, D.; WIRTH, G. I. Modeling Quantum Confinement in Multi-Gate Transistors with Effective Potential. 36th Symposium on Microelectronics Technology, SBMICRO 2022 - Proceedings, Aug. 2022. | |
dc.identifier.doi | 10.1109/SBMICRO55822.2022.9881047 | |
dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/4631 | |
dc.relation.ispartof | 36th Symposium on Microelectronics Technology, SBMICRO 2022 - Proceedings | |
dc.rights | Acesso Restrito | |
dc.subject.otherlanguage | effective potential | |
dc.subject.otherlanguage | FinFET | |
dc.subject.otherlanguage | nanowire transistors | |
dc.subject.otherlanguage | quantum confinement | |
dc.title | Modeling Quantum Confinement in Multi-Gate Transistors with Effective Potential | |
dc.type | Artigo de evento | |
fei.scopus.citations | 3 | |
fei.scopus.eid | 2-s2.0-85139186418 | |
fei.scopus.subject | Device simulators | |
fei.scopus.subject | Effective potentials | |
fei.scopus.subject | Line density | |
fei.scopus.subject | Multigate transistors | |
fei.scopus.subject | N type silicon | |
fei.scopus.subject | Nanowire transistors | |
fei.scopus.subject | Performance and reliabilities | |
fei.scopus.subject | Poisson solvers | |
fei.scopus.subject | Quantum behaviors | |
fei.scopus.subject | Theoretical modeling | |
fei.scopus.updated | 2024-12-01 | |
fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85139186418&origin=inward |