Impact of using Octogonal Layout Style in Planar Power MOSFETs
dc.contributor.author | DA SILVA, G. A. | |
dc.contributor.author | Salvador Gimenez | |
dc.date.accessioned | 2022-11-01T06:04:21Z | |
dc.date.available | 2022-11-01T06:04:21Z | |
dc.date.issued | 2022-08-22 | |
dc.description.abstract | © 2022 IEEE.Previous studies have already shown that the use of alternative gate shapes for planar and tridimensional MOSFETs are capable of boosting their analog and digital electrical performances and their ionizing radiations robustness. In this scenario, this work has the objective to study the impact of the use of octagonal layout style (OCTO), as the basic cell, to the implementing of the Planar Power MOSFET (PPM). The main results of this paper show that the PPM layouted with OCTO layout styles, as the basic cells, are able to improve the drain saturation current (IDS-sat) about 668%%, in relation to that implemented with conventional rectangular layout style, considering that they present the same gate area and bias conditions. Therefore, this type of layout approach can be considered an alternative layout to improve the electrical performance of PPMs. | |
dc.identifier.citation | DA SILVA, G. A.; GIMEZES, S. Impact of using Octogonal Layout Style in Planar Power MOSFETs. 36th Symposium on Microelectronics Technology, SBMICRO 2022 - Proceedings, aug. 2022. | |
dc.identifier.doi | 10.1109/SBMICRO55822.2022.9881042 | |
dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/4626 | |
dc.relation.ispartof | 36th Symposium on Microelectronics Technology, SBMICRO 2022 - Proceedings | |
dc.rights | Acesso Restrito | |
dc.title | Impact of using Octogonal Layout Style in Planar Power MOSFETs | |
dc.type | Artigo de evento | |
fei.scopus.citations | 0 | |
fei.scopus.eid | 2-s2.0-85139237101 | |
fei.scopus.subject | Bias conditions | |
fei.scopus.subject | Cell-be | |
fei.scopus.subject | Cell/B.E | |
fei.scopus.subject | Cell/BE | |
fei.scopus.subject | Drain saturation current | |
fei.scopus.subject | Electrical performance | |
fei.scopus.subject | MOSFETs | |
fei.scopus.updated | 2025-02-01 | |
fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85139237101&origin=inward |