Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis

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dc.contributor.authorOLIVEIRA, A.
dc.contributor.authorBENEVENUTI, F.
dc.contributor.authorBENITES, L.
dc.contributor.authorRODRIGUES, G.
dc.contributor.authorKASTENSMIDT, F.
dc.contributor.authorADDED, N.
dc.contributor.authorAGUIAR, V.
dc.contributor.authorMEDINA, N.
dc.contributor.authorMarcilei Aparecida Guazzelli
dc.contributor.authorTAMBARA, L.
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-7110-7241
dc.date.accessioned2022-01-12T21:56:15Z
dc.date.available2022-01-12T21:56:15Z
dc.date.issued2019
dc.description.abstract© 2019 Elsevier LtdNanoXplore is the European pioneer vendor to develop ITAR-free radiation-hardened SRAM-based FPGAs. This work is the first to explore dynamic SEE tests in the NG-Medium FPGA device. The reliability-performance analysis of an embedded unmitigated design is performed under heavy ion-induced errors. Moreover, the improvements of additional user level fault-tolerance techniques, such as redundancy and scrubbing, are explored. The design sensitiveness is evaluated through dynamic cross section, mean fluence to failure, and empiric reliability. Results obtained demonstrate the best tradeoff between area, performance, and reliability is achieved combining full design redundancy, periodic scrubbing, arithmetic functions implemented in DSPs, logical resets between executions, and area-oriented application execution.
dc.description.volume100-101
dc.identifier.citationOLIVEIRA, A.; BENEVENUTI, F.; BENITES, L.; RODRIGUES, G.; KASTENSMIDT, F.; ADDED, N.; AGUIAR, V.; MEDINA, N.; GUAZZELLI, M. A.; TAMBARA, L. Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis. Microelectronics Reliability, v. 100-101, Sept. 2019.
dc.identifier.doi10.1016/j.microrel.2019.113437
dc.identifier.issn0026-2714
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3712
dc.relation.ispartofMicroelectronics Reliability
dc.rightsAcesso Restrito
dc.titleDynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis
dc.typeArtigo
fei.scopus.citations1
fei.scopus.eid2-s2.0-85074729111
fei.scopus.subjectApplication execution
fei.scopus.subjectArithmetic functions
fei.scopus.subjectFault tolerance techniques
fei.scopus.subjectFPGA devices
fei.scopus.subjectRadiation-hardened
fei.scopus.subjectReliability performance
fei.scopus.subjectSRAM-based FPGA
fei.scopus.subjectUser levels
fei.scopus.updated2024-07-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85074729111&origin=inward
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