A New Method for Series Resistance Extraction of Nanometer MOSFETs

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dc.contributor.authorTREVISOLI, R.
dc.contributor.authorPAVANELLO, M. A.
dc.contributor.authorDORIA, R. T.
dc.contributor.authorDE SOUZA, M.
dc.contributor.authorBARRAUD, S.
dc.contributor.authorVINET, M.
dc.contributor.authorCASSE, M.
dc.contributor.authorREIMBOLD, G.
dc.contributor.authorFAYNOT, O.
dc.contributor.authorGHIBAUDO, G.
dc.date.accessioned2019-08-19T23:45:27Z
dc.date.available2019-08-19T23:45:27Z
dc.date.issued2017
dc.description.firstpage2797
dc.description.lastpage2803
dc.description.volume64
dc.identifier.citationTREVISOLI, R.; PAVANELLO, M. A.; DORIA, R. T.; DE SOUZA, M.; BARRAUD, S.; VINET, M.; CASSE, M.; REIMBOLD, G.; FAYNOT, O.; GHIBAUDO, G.. A New Method for Series Resistance Extraction of Nanometer MOSFETs. IEEE TRANSACTIONS ON ELECTRON DEVICES, v. 64, p. 2797-2803, 2017.
dc.identifier.doi10.1109/ted.2017.2704928
dc.identifier.issn0018-9383
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/1290
dc.relation.ispartofIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.rightsAcesso Restrito
dc.titleA New Method for Series Resistance Extraction of Nanometer MOSFETspt_BR
dc.typeArtigopt_BR
fei.scopus.citations16
fei.scopus.eid2-s2.0-85020099682
fei.scopus.updated2024-03-04
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