Brazilian facilities to study radiation effects in electronic devices

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dc.contributor.authorMEDINA, N. H.
dc.contributor.authorSantos, R. B. B.
dc.contributor.authorSEIXAS, L. E.
dc.contributor.authorTABACNIKS, M. H.
dc.contributor.authorSILVEIRA, M. A. G.
dc.contributor.authorADDED, N.
dc.contributor.authorAGUIAR, V. A. P.
dc.contributor.authorAGUIRRE, F.
dc.contributor.authorGIACOMINI, R.
dc.contributor.authorMACCHIONE, E. L. A.
dc.contributor.authorDE MELO, M. A. A.
dc.contributor.authorOLIVEIRA, J. A.
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-7110-7241
dc.date.accessioned2019-08-19T23:47:19Z
dc.date.available2019-08-19T23:47:19Z
dc.date.issued2013-05-05
dc.description.firstpage1
dc.description.lastpage7
dc.description.volume147027
dc.identifier.citationMEDINA, N. H.; Santos, R. B. B.; SEIXAS, L. E.; TABACNIKS, M. H.; SILVEIRA, M. A. G.; ADDED, N.; AGUIAR, V. A. P.; AGUIRRE, F.; GIACOMINI, R.; MACCHIONE, E. L. A.; DE MELO, M. A. A.; OLIVEIRA, J. A. Brazilian facilities to study radiation effects in electronic devices. IEEE, v. 147027, p. 1-7, 2013.
dc.identifier.doi10.1109/radecs.2013.6937368
dc.identifier.issn9781-4673
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/1458
dc.relation.ispartofIEEE
dc.rightsAcesso Restrito
dc.titleBrazilian facilities to study radiation effects in electronic devicespt_BR
dc.typeArtigopt_BR
fei.scopus.citations0
fei.scopus.eid2-s2.0-84949926001
fei.scopus.updated2024-05-01
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