Please use this identifier to cite or link to this item: https://repositorio.fei.edu.br/handle/FEI/3280
Title: Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits
Authors: GOERL, ROGER
VILLA, PAULO
VARGAS, FABIAN L.
MARCON, CÉSAR A.
MEDINA, NILBERTO H.
ADDED, NEMITALA
GUAZZELLI, Marcilei Aparecida
Issue Date: 2019
Abstract: International standards have been proposed and used to test Integrated Circuits (ICs) for Total-Ionizing Dose (TID) and Single-Event Upset (SEU) as well as for Electromagnetic Interference (EMI). Nevertheless, these standards are separately applied to the IC or electronic system, one after the other, and do not take into account the combined effects of these types of radiation may take over the ICs. In more detail, there is no standard that rules combined tests for TID, SEU and EMI. This paper aims to fulfill this lack of product quality information and proposes a new methodology to improve the reliability of ICs by performing combined tests for TID, SEU and EMI. We also present recent experimental results from combined measurements that we performed on a commercial FPGA IC widely used in critical embedded applications such as aerospace and automotive. Such results strongly suggest that the effects of radiation are not negligible and should be taken into account if one intends to design reliable embedded systems.
Keywords: Total-ionizing dose (TID) radiation Single-event upset (SEU) radiation Electromagnetic interference (EMI) Transient fault Combined laboratory test strategy
Journal: MICROELECTRONICS RELIABILITY
ISSN: 0026-2714
Citation: GOERL, ROGER; VILLA, PAULO; VARGAS, FABIAN L.; MARCON, CÉSAR A.; MEDINA, NILBERTO H.; ADDED, NEMITALA; Guazzelli, Marcilei A.. Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits. MICROELECTRONICS RELIABILITY, v. 100, p. 113341, 2019.
Access Type: Acesso Restrito
DOI: 10.1016/j.microrel.2019.06.033
URI: https://repositorio.fei.edu.br/handle/FEI/3280
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