Simulation comparison of self-heating effects in Junctionless Nanowire Transistos and FinFET devices
dc.contributor.author | MARINIELLO, G. | |
dc.contributor.author | Marcelo Antonio Pavanello | |
dc.date.accessioned | 2022-01-12T22:00:16Z | |
dc.date.available | 2022-01-12T22:00:16Z | |
dc.date.issued | 2015-05-24 | |
dc.description.abstract | This paper aims at comparing the self-heating effects influence between FinFETs and Junctionless Nanowire Transistors (JNT) based on three-dimensional numerical simulations. The self-heating of JNT made with different materials, Silicon and Silicon Carbide, is also studied. The results show lower impact in JNT compared to FinFETs. Also, the self-heating is lower in silicon devices then silicon carbide. | |
dc.description.firstpage | 259 | |
dc.description.issuenumber | 1 | |
dc.description.lastpage | 266 | |
dc.description.volume | 66 | |
dc.identifier.citation | MARINIELLO, G.; PAVANELLO, M. A. Simulation comparison of self-heating effects in Junctionless Nanowire Transistos and FinFET devices. ECS Transactions. v, 66, n, 1, p. 259-266, Mayo, 2015. | |
dc.identifier.doi | 10.1149/06601.0259ecst | |
dc.identifier.issn | 1938-6737 | |
dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/3988 | |
dc.relation.ispartof | ECS Transactions | |
dc.rights | Acesso Restrito | |
dc.title | Simulation comparison of self-heating effects in Junctionless Nanowire Transistos and FinFET devices | |
dc.type | Artigo de evento | |
fei.scopus.citations | 0 | |
fei.scopus.eid | 2-s2.0-84931405667 | |
fei.scopus.subject | FinFET devices | |
fei.scopus.subject | FinFETs | |
fei.scopus.subject | Junctionless nanowire transistors (JNT) | |
fei.scopus.subject | Self-heating | |
fei.scopus.subject | Self-heating effect | |
fei.scopus.subject | Silicon devices | |
fei.scopus.subject | Simulation comparison | |
fei.scopus.subject | Three-dimensional numerical simulations | |
fei.scopus.updated | 2024-10-01 | |
fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84931405667&origin=inward |