Influence of temperature on the operation of strained triple-gate FinFETs
| dc.contributor.advisorOrcid | https://orcid.org/0000-0003-1361-3650 | |
| dc.contributor.author | Marcelo Antonio Pavanello | |
| dc.contributor.author | MARTINO, J. A. | |
| dc.contributor.author | SIMOEN, E. | |
| dc.contributor.author | ROOYACKERS, R. | |
| dc.contributor.author | COLLAERT, N. | |
| dc.contributor.author | CLAEYS, C. | |
| dc.date.accessioned | 2022-01-12T22:04:47Z | |
| dc.date.available | 2022-01-12T22:04:47Z | |
| dc.date.issued | 2008-10-09 | |
| dc.description.firstpage | 55 | |
| dc.description.lastpage | 56 | |
| dc.identifier.citation | PAVANELLO, M. A.; MARTINO, J. A.; SIMOEN, E.; ROOYACKERS, R.; COLLAERT, N.; CLAEYS, C. Influence of temperature on the operation of strained triple-gate FinFETs. Proceedings - IEEE International SOI Conference, p. 55-56, 2008. | |
| dc.identifier.doi | 10.1109/SOI.2008.4656291 | |
| dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/4294 | |
| dc.relation.ispartof | Proceedings - IEEE International SOI Conference | |
| dc.rights | Acesso Restrito | |
| dc.title | Influence of temperature on the operation of strained triple-gate FinFETs | |
| dc.type | Artigo de evento | |
| fei.scopus.citations | 1 | |
| fei.scopus.eid | 2-s2.0-57749188467 | |
| fei.scopus.updated | 2025-02-01 | |
| fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=57749188467&origin=inward |