Influence of temperature on the operation of strained triple-gate FinFETs

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dc.contributor.advisorOrcidhttps://orcid.org/0000-0003-1361-3650
dc.contributor.authorMarcelo Antonio Pavanello
dc.contributor.authorMARTINO, J. A.
dc.contributor.authorSIMOEN, E.
dc.contributor.authorROOYACKERS, R.
dc.contributor.authorCOLLAERT, N.
dc.contributor.authorCLAEYS, C.
dc.date.accessioned2022-01-12T22:04:47Z
dc.date.available2022-01-12T22:04:47Z
dc.date.issued2008-10-09
dc.description.firstpage55
dc.description.lastpage56
dc.identifier.citationPAVANELLO, M. A.; MARTINO, J. A.; SIMOEN, E.; ROOYACKERS, R.; COLLAERT, N.; CLAEYS, C. Influence of temperature on the operation of strained triple-gate FinFETs. Proceedings - IEEE International SOI Conference, p. 55-56, 2008.
dc.identifier.doi10.1109/SOI.2008.4656291
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/4294
dc.relation.ispartofProceedings - IEEE International SOI Conference
dc.rightsAcesso Restrito
dc.titleInfluence of temperature on the operation of strained triple-gate FinFETs
dc.typeArtigo de evento
fei.scopus.citations1
fei.scopus.eid2-s2.0-57749188467
fei.scopus.updated2024-07-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=57749188467&origin=inward
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