A new series resistance extraction method for junctionless nanowire transistors

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dc.contributor.authorTREVISOLI, R.
dc.contributor.authorRodrido Doria
dc.contributor.authorMichelly De Souza
dc.contributor.authorBARRAUD, S.
dc.contributor.authorVINET, M.
dc.contributor.authorMarcelo Antonio Pavanello
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-4448-4337
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-6472-4807
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1361-3650
dc.date.accessioned2022-01-12T21:58:40Z
dc.date.available2022-01-12T21:58:40Z
dc.date.issued2016-11-02
dc.description.abstractSeries resistance can severely affect the electrical behavior of such Junctionless Nanowire Transistors. The aim of this work is to propose a new method for the extraction of the series resistance in Junctionless Nanowire Transistors. The method is validated by means of tridimensional numerical simulations and experimental results, using transistors with different widths and doping concentrations.
dc.identifier.citationTREVISOLI, R.; DORIA, R.; DE SOUZA, M.; BARRAUD, S.; VINET, M.; PAVANELLO, M. A. A new series resistance extraction method for junctionless nanowire transistors. SBMicro 2016 - 31st Symposium on Microelectronics Technology and Devices: Chip on the Mountains, co-located 29th SBCCI - Circuits and Systems Design, 6th WCAS - IC Design Cases, 1st INSCIT - Electronic Instrumentation and 16th SForum - Undergraduate-Student Forum, Nov, 2016.
dc.identifier.doi10.1109/SBMicro.2016.7731338
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3877
dc.relation.ispartofSBMicro 2016 - 31st Symposium on Microelectronics Technology and Devices: Chip on the Mountains, co-located 29th SBCCI - Circuits and Systems Design, 6th WCAS - IC Design Cases, 1st INSCIT - Electronic Instrumentation and 16th SForum - Undergraduate-Student Forum
dc.rightsAcesso Restrito
dc.subject.otherlanguageExtraction Method
dc.subject.otherlanguageJunctionless Transistors
dc.subject.otherlanguageSeries Resistance
dc.titleA new series resistance extraction method for junctionless nanowire transistors
dc.typeArtigo de evento
fei.scopus.citations5
fei.scopus.eid2-s2.0-85007339511
fei.scopus.subjectDoping concentration
fei.scopus.subjectElectrical behaviors
fei.scopus.subjectExtraction method
fei.scopus.subjectJunctionless transistors
fei.scopus.subjectNanowire transistors
fei.scopus.subjectSeries resistances
fei.scopus.updated2024-05-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85007339511&origin=inward
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