Back bias influence on analog performance of pTFET

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dc.contributor.authorAGOPIAN, P. G. D.
dc.contributor.authorNEVES, F. S.
dc.contributor.authorMARTINO, J. A.
dc.contributor.authorVANDOOREN, A.
dc.contributor.authorROOYACKERS, R.
dc.contributor.authorSIMOEN, E.
dc.contributor.authorCLAEYS, C.
dc.date.accessioned2022-01-12T22:01:41Z
dc.date.available2022-01-12T22:01:41Z
dc.date.issued2013-10-10
dc.description.abstractIn this work the back bias influence on the analog performance of tunnel-FETs is evaluated experimentally for the first time. The analysis of the transconductance, output conductance and intrinsic voltage gain (Av) was performed by comparing the pTFET behavior with a well-known pFinFET that was fabricated using the same process flow. Numerical simulations were also performed in order to explain the pTFET behavior. Although the pTFET shows to be more susceptible to the back bias condition, it also shows to present always a better Av for all bias conditions. The best result in both devices was obtained when the back bias is near 0 V and the Av difference is around 30 dB in favor of pTFET. © 2013 IEEE.
dc.identifier.citationAGOPIAN, P. G. D.; NEVES, F. S.; MARTINO, J. A.; VANDOOREN, A.; ROOYACKERS, R.; SIMOEN, E.; CLAEYS, C. Back bias influence on analog performance of pTFET. 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2013, Oct. 2013.
dc.identifier.doi10.1109/S3S.2013.6716584
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/4085
dc.relation.ispartof2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, S3S 2013
dc.rightsAcesso Restrito
dc.titleBack bias influence on analog performance of pTFET
dc.typeArtigo de evento
fei.scopus.citations3
fei.scopus.eid2-s2.0-84897713722
fei.scopus.subjectAnalog performance
fei.scopus.subjectBack bias
fei.scopus.subjectBias conditions
fei.scopus.subjectIntrinsic voltage gains
fei.scopus.subjectOutput conductance
fei.scopus.subjectProcess flows
fei.scopus.updated2024-08-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84897713722&origin=inward
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