Impact of series resistance on the drain current variability in inversion mode and junctionless nanowire transistors

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dc.contributor.advisorOrcidhttps://orcid.org/0000-0001-6472-4807
dc.contributor.authorSILVA, L. M. B. DA
dc.contributor.authorMarcelo Antonio Pavanello
dc.contributor.authorCASSÉ, M.
dc.contributor.authorBARRAUD, S.
dc.contributor.authorVINET, M.
dc.contributor.authorFAYNOT, O.
dc.contributor.authorMichelly De Souza
dc.date.accessioned2023-09-01T06:03:48Z
dc.date.available2023-09-01T06:03:48Z
dc.date.issued2023-10-05
dc.description.abstract© 2023 Elsevier LtdThis work analyzes the influence of source-drain series resistance variability over the drain current in junctionless and inversion mode nanowire transistors. A comparison between drain current and Y-function variability is presented using experimental data of nanowires with different widths and channel lengths. The source-drain series resistance variability is also presented. The results indicates that source-drain series resistance influence is higher on drain current variability for junctionless than inversion mode nanowire transistors.
dc.description.volume208
dc.identifier.citationSILVA, L. M. B. DA; PAVANELLO, M. A.; CASSÉ, M.; BARRAUD, S.; VINET, M.; FAYNOT, O.; DE SOUZA, M. Impact of series resistance on the drain current variability in inversion mode and junctionless nanowire transistors. Solid-State Electronics, v. 208, oct. 2023.
dc.identifier.doi10.1016/j.sse.2023.108737
dc.identifier.issn0038-1101
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/5082
dc.relation.ispartofSolid-State Electronics
dc.rightsAcesso Restrito
dc.subject.otherlanguageElectrical characterization
dc.subject.otherlanguageMOSFET
dc.subject.otherlanguageNanowire transistors
dc.subject.otherlanguageParameter extraction
dc.subject.otherlanguageSeries resistance
dc.subject.otherlanguageSOI
dc.subject.otherlanguageVariability
dc.titleImpact of series resistance on the drain current variability in inversion mode and junctionless nanowire transistors
dc.typeArtigo
fei.scopus.citations1
fei.scopus.eid2-s2.0-85168416879
fei.scopus.subjectElectrical characterization
fei.scopus.subjectInversion modes
fei.scopus.subjectMOS-FET
fei.scopus.subjectMOSFETs
fei.scopus.subjectNanowire transistors
fei.scopus.subjectParameters extraction
fei.scopus.subjectSeries resistances
fei.scopus.subjectSOI
fei.scopus.subjectSource/drain series resistances
fei.scopus.subjectVariability
fei.scopus.updated2024-12-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85168416879&origin=inward
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