Effective channel length in Junctionless Nanowire Transistors

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dc.contributor.authorTREVISOLLI, R.
dc.contributor.authorRodrido Doria
dc.contributor.authorMichelly De Souza
dc.contributor.authorMarcelo Antonio Pavanello
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-4448-4337
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-6472-4807
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1361-3650
dc.date.accessioned2022-01-12T21:59:41Z
dc.date.available2022-01-12T21:59:41Z
dc.date.issued2015-10-13
dc.description.abstractThe aim of this work is to analyze the influence of the lateral depletion induced by the gate towards the source/drain regions on the effective channel length of Junctionless Nanowire Transistors. The effective channel length increase at the subthreshold regime is analyzed by means of simulations together with experimental results, showing that the JNT can be significantly longer than the gate length.
dc.identifier.citationTREVISOLLI, R.; DORIA R., DE SOUZA, M.; PAVANELLO, M. A. Effective channel length in Junctionless Nanowire Transistors. SBMicro 2015 - 30th Symposium on Microelectronics Technology and Devices. Oct. 2015.
dc.identifier.doi10.1109/SBMicro.2015.7298144
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3948
dc.relation.ispartofSBMicro 2015 - 30th Symposium on Microelectronics Technology and Devices
dc.rightsAcesso Restrito
dc.subject.otherlanguageEffective Channel Length
dc.subject.otherlanguageJunctionless Transistors
dc.subject.otherlanguageSubthreshold Operation
dc.titleEffective channel length in Junctionless Nanowire Transistors
dc.typeArtigo de evento
fei.scopus.citations15
fei.scopus.eid2-s2.0-84961844730
fei.scopus.subjectEffective channel length
fei.scopus.subjectGate length
fei.scopus.subjectJunctionless transistors
fei.scopus.subjectNanowire transistors
fei.scopus.subjectSource/drain regions
fei.scopus.subjectSubthreshold
fei.scopus.subjectSubthreshold operation
fei.scopus.updated2024-07-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84961844730&origin=inward
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