Performance of ultra-low-power SOI CMOS diodes operating at low temperatures
dc.contributor.author | Michelly De Souza | |
dc.contributor.author | RUE, B. | |
dc.contributor.author | FLANDRE, D. | |
dc.contributor.author | Marcelo Antonio Pavanello | |
dc.contributor.authorOrcid | https://orcid.org/0000-0003-1361-3650 | |
dc.contributor.authorOrcid | https://orcid.org/0000-0001-6472-4807 | |
dc.date.accessioned | 2022-01-12T22:03:26Z | |
dc.date.available | 2022-01-12T22:03:26Z | |
dc.date.issued | 2011-01-05 | |
dc.description.abstract | In this work the low temperature performance of ultra-low-power SOI CMOS diodes is presented. Experimental measurements performed in fabricated devices from 148K to 373K show that the temperature lowering can promote a significant leakage current reduction and increase of the forward current. Two-dimensional numerical simulations are used to extend the studied temperature range and analyze the doping concentration influence on the low temperature operation of these diodes. ©The Electrochemical Society. | |
dc.description.firstpage | 325 | |
dc.description.issuenumber | 5 | |
dc.description.lastpage | 330 | |
dc.description.volume | 35 | |
dc.identifier.citation | DE SOUZA, M.; RUE, B.; FLANDRE, D.; PAVANELLO, M. A. Performance of ultra-low-power SOI CMOS diodes operating at low temperatures. ECS Transactions, v.35, n. 5, p. 325-330, Jan. 2011. | |
dc.identifier.doi | 10.1149/1.3570813 | |
dc.identifier.issn | 1938-5862 | |
dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/4204 | |
dc.relation.ispartof | ECS Transactions | |
dc.rights | Acesso Restrito | |
dc.title | Performance of ultra-low-power SOI CMOS diodes operating at low temperatures | |
dc.type | Artigo de evento | |
fei.scopus.citations | 1 | |
fei.scopus.eid | 2-s2.0-79960488110 | |
fei.scopus.subject | Doping concentration | |
fei.scopus.subject | Experimental measurements | |
fei.scopus.subject | Fabricated device | |
fei.scopus.subject | Forward currents | |
fei.scopus.subject | Leakage current reduction | |
fei.scopus.subject | Low temperature performance | |
fei.scopus.subject | Low temperatures | |
fei.scopus.subject | SOI CMOS | |
fei.scopus.subject | Temperature range | |
fei.scopus.subject | Two-dimensional numerical simulation | |
fei.scopus.subject | Ultra-low power | |
fei.scopus.updated | 2025-02-01 | |
fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=79960488110&origin=inward |