Heavy ions induced single event upsets testing of the 28 nm Xilinx Zynq-7000 all programmable SoC
Nenhuma Miniatura disponível
Citações na Scopus
34
Tipo de produção
Artigo de evento
Data
2015-07-13
Autores
TAMBARA, L. A.
KASTENSMIDT, F. L.
MEDINA, N. H.
ADDED, N.
AGUIAR, V. A. P.
AGUIRRE, F.
MACCHIONE, E. L. A.
Marcilei Aparecida Guazzelli
KASTENSMIDT, F. L.
MEDINA, N. H.
ADDED, N.
AGUIAR, V. A. P.
AGUIRRE, F.
MACCHIONE, E. L. A.
Marcilei Aparecida Guazzelli
Orientador
Periódico
IEEE Radiation Effects Data Workshop
Título da Revista
ISSN da Revista
Título de Volume
Citação
TAMBARA, L. A.; KASTENSMIDT, F. L.; MEDINA, N. H.; ADDED, N.; AGUIAR, V. A. P.; AGUIRRE, F.; MACCHIONE, E. L. A.; GUAZZELLI, M. A. Heavy ions induced single event upsets testing of the 28 nm Xilinx Zynq-7000 all programmable SoC. IEEE Radiation Effects Data Workshop, v. 2015-November, Jul. 2015.
Texto completo (DOI)
Palavras-chave
Resumo
© 2015 IEEE.The recent advance of silicon technology has allowed the integration of complex systems in a single chip. Nowadays, Field Programmable Gate Array (FPGA) devices are composed not only of the programmable fabric but also by hard-core processors, dedicated processing block interfaces to various peripherals, on-chip bus structures and analog blocks. Among the latest released devices of this type, this work focuses in the 28 nm Xilinx Zynq-7000 All Programmable SoC (APSoC). While not immune to the radiation environment in space, the Zynq-7000 seems to be very attractive for the aerospace sector due to its high computational power capability and low-power consumption. In this work, results from heavy ions testing for Zynq-7000 are presented. The experiments were performed in a Brazilian facility located at the University of São Paulo, Brazil.