Cross-coupling effects in common-source current mirrors composed by UTBB transistors

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dc.contributor.authorJOSÉ DA COSTA, F.
dc.contributor.authorTREVISOLI, R.
dc.contributor.authorRodrigo Doria
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-4448-4337
dc.date.accessioned2022-06-01T06:04:56Z
dc.date.available2022-06-01T06:04:56Z
dc.date.issued2022
dc.description.abstract© 2022 Elsevier LtdThis work performs an analysis of the cross-coupling effects influence on the performance of current mirrors composed by advanced UTBB SOI MOSFETs through 3D numerical simulations validated to experimental data of single devices. It is shown the presence of a capacitive coupling acting in the system, which can be demonstrated through the threshold voltage reduction at small distances between devices. Additionally, the temperature rise in the system due to the thermal coupling provokes a decrease in the input current as the devices become closer to each other. This is responsible for an increase of 3 % on ID2/ID1 ratio when the devices are biased at the same time and when the distance between them is lowered to 100 nm.
dc.description.volume194
dc.identifier.citationJOSÉ DA COSTA, F.; TREVISOLI, R.; DORIA R. Cross-coupling effects in common-source current mirrors composed by UTBB transistors. Solid-State Electronics, v. 194, 2022.
dc.identifier.doi10.1016/j.sse.2022.108352
dc.identifier.issn0038-1101
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/4500
dc.relation.ispartofSolid-State Electronics
dc.rightsAcesso Restrito
dc.subject.otherlanguageCoupling effects
dc.subject.otherlanguageCurrent mirrors
dc.subject.otherlanguageSOI
dc.subject.otherlanguageUTBB
dc.titleCross-coupling effects in common-source current mirrors composed by UTBB transistors
dc.typeArtigo
fei.scopus.citations1
fei.scopus.eid2-s2.0-85129304470
fei.scopus.subject3-D numerical simulation
fei.scopus.subjectCommon source
fei.scopus.subjectCoupling effect
fei.scopus.subjectCross-couplings
fei.scopus.subjectCurrent mirrors
fei.scopus.subjectPerformance
fei.scopus.subjectSOI
fei.scopus.subjectSOI-MOSFETs
fei.scopus.subjectSource currents
fei.scopus.subjectUTBB
fei.scopus.updated2024-07-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85129304470&origin=inward
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