Study of total quantum efficiency of lateral SOI PIN photodiodes with back-gate bias, intrinsic length and temperature variation

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dc.contributor.authorNOVO, C. D.
dc.contributor.authorBAPTISTA, J.
dc.contributor.authorMarcilei Aparecida Guazzelli
dc.contributor.authorRenato Giacomini
dc.contributor.authorAFZALIAN, A.
dc.contributor.authorFLANDRE, D.
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1060-2649
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-7110-7241
dc.date.accessioned2022-01-12T22:00:17Z
dc.date.available2022-01-12T22:00:17Z
dc.date.issued2015
dc.description.abstract© The Electrochemical Society.This paper addresses, for the first time, an analysis of the total quantum efficiency of lateral SOI PIN photodiodes with different intrinsic lengths in the 300 to 500 K range simultaneously considering back-gate bias and temperature influences. Experimental results showed that the mode of operation changes the behavior of the devices concerning dark and photocurrents, while the temperature variation produces different trades in quantum efficiency related to the absorption length and the diffusion length variation.
dc.description.firstpage101
dc.description.issuenumber5
dc.description.lastpage107
dc.description.volume66
dc.identifier.citationNOVO, C. D.; BAPTISTA, J.; GUAZZELLI, M.A.; GIACOMINI, R.; AFZALIAN, A.; FLANDRE, D. Study of total quantum efficiency of lateral SOI PIN photodiodes with back-gate bias, intrinsic length and temperature variation. ECS Transactions, v. 66, n. 5, p. 101-107, 2015.
dc.identifier.doi10.1149/06605.0101ecst
dc.identifier.issn1938-6737
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3989
dc.relation.ispartofECS Transactions
dc.rightsAcesso Restrito
dc.titleStudy of total quantum efficiency of lateral SOI PIN photodiodes with back-gate bias, intrinsic length and temperature variation
dc.typeArtigo de evento
fei.scopus.citations2
fei.scopus.eid2-s2.0-84931374603
fei.scopus.subjectAbsorption length
fei.scopus.subjectBack-gate bias
fei.scopus.subjectDiffusion length
fei.scopus.subjectMode of operations
fei.scopus.subjectPin photodiode
fei.scopus.subjectTemperature influence
fei.scopus.subjectTemperature variation
fei.scopus.updated2024-11-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84931374603&origin=inward
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