Analysis of lateral SOI PIN diodes for the detection of blue and UV wavelengths in a wide temperature range
dc.contributor.advisorOrcid | https://orcid.org/0000-0001-6472-4807 | |
dc.contributor.author | Michelly De Souza | |
dc.contributor.author | BULTEEL, O. | |
dc.contributor.author | FLANDRE, D. | |
dc.contributor.author | Marcelo Antonio Pavanello | |
dc.contributor.authorOrcid | https://orcid.org/0000-0003-1361-3650 | |
dc.date.accessioned | 2022-01-12T22:03:53Z | |
dc.date.available | 2022-01-12T22:03:53Z | |
dc.date.issued | 2010-01-05 | |
dc.description.abstract | This work presents an analysis on the performance of lateral thin-film SOI PIN diodes for the detection of short wavelengths, in the range of blue and ultra-violet (UV) wavelengms, as a function of the temperature, reaching the cryogenic regime. Measurements performed for temperatures ranging from 100 K to 400 K showed mat the optical responsitivity of these photodetectors is affected by temperature change, being reduced at low and moderately high temperatures. Two-dimensional numerical simulations were performed showing the same trends as the experimental data, and were used to predict the influence of silicon film thickness downscaling on me photodetector performance. ©The Electrochemical Society. | |
dc.description.firstpage | 199 | |
dc.description.issuenumber | 1 | |
dc.description.lastpage | 206 | |
dc.description.volume | 31 | |
dc.identifier.citation | DE SOUZA, M.; BULTEEL, O.; FLANDRE, D.; PAVANELLO, M. A. Analysis of lateral SOI PIN diodes for the detection of blue and UV wavelengths in a wide temperature range. ECS Transactions, v. 31, n.1, p. 199-206, 2010. | |
dc.identifier.doi | 10.1149/1.3474159 | |
dc.identifier.issn | 1938-5862 | |
dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/4234 | |
dc.relation.ispartof | ECS Transactions | |
dc.rights | Acesso Restrito | |
dc.title | Analysis of lateral SOI PIN diodes for the detection of blue and UV wavelengths in a wide temperature range | |
dc.type | Artigo de evento | |
fei.scopus.citations | 7 | |
fei.scopus.eid | 2-s2.0-79952472010 | |
fei.scopus.subject | Down-scaling | |
fei.scopus.subject | Experimental data | |
fei.scopus.subject | Moderately high temperature | |
fei.scopus.subject | PiN diode | |
fei.scopus.subject | Short wavelengths | |
fei.scopus.subject | Silicon film thickness | |
fei.scopus.subject | Temperature changes | |
fei.scopus.subject | Temperature range | |
fei.scopus.subject | Two-dimensional numerical simulation | |
fei.scopus.subject | Ultra-violet | |
fei.scopus.subject | UV wavelength | |
fei.scopus.updated | 2025-02-01 | |
fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=79952472010&origin=inward |