Repositório do Conhecimento Institucional do Centro Universitário FEI
 

Analysis of lateral SOI PIN diodes for the detection of blue and UV wavelengths in a wide temperature range

dc.contributor.advisorOrcidhttps://orcid.org/0000-0001-6472-4807
dc.contributor.authorMichelly De Souza
dc.contributor.authorBULTEEL, O.
dc.contributor.authorFLANDRE, D.
dc.contributor.authorMarcelo Antonio Pavanello
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1361-3650
dc.date.accessioned2022-01-12T22:03:53Z
dc.date.available2022-01-12T22:03:53Z
dc.date.issued2010-01-05
dc.description.abstractThis work presents an analysis on the performance of lateral thin-film SOI PIN diodes for the detection of short wavelengths, in the range of blue and ultra-violet (UV) wavelengms, as a function of the temperature, reaching the cryogenic regime. Measurements performed for temperatures ranging from 100 K to 400 K showed mat the optical responsitivity of these photodetectors is affected by temperature change, being reduced at low and moderately high temperatures. Two-dimensional numerical simulations were performed showing the same trends as the experimental data, and were used to predict the influence of silicon film thickness downscaling on me photodetector performance. ©The Electrochemical Society.
dc.description.firstpage199
dc.description.issuenumber1
dc.description.lastpage206
dc.description.volume31
dc.identifier.citationDE SOUZA, M.; BULTEEL, O.; FLANDRE, D.; PAVANELLO, M. A. Analysis of lateral SOI PIN diodes for the detection of blue and UV wavelengths in a wide temperature range. ECS Transactions, v. 31, n.1, p. 199-206, 2010.
dc.identifier.doi10.1149/1.3474159
dc.identifier.issn1938-5862
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/4234
dc.relation.ispartofECS Transactions
dc.rightsAcesso Restrito
dc.titleAnalysis of lateral SOI PIN diodes for the detection of blue and UV wavelengths in a wide temperature range
dc.typeArtigo de evento
fei.scopus.citations7
fei.scopus.eid2-s2.0-79952472010
fei.scopus.subjectDown-scaling
fei.scopus.subjectExperimental data
fei.scopus.subjectModerately high temperature
fei.scopus.subjectPiN diode
fei.scopus.subjectShort wavelengths
fei.scopus.subjectSilicon film thickness
fei.scopus.subjectTemperature changes
fei.scopus.subjectTemperature range
fei.scopus.subjectTwo-dimensional numerical simulation
fei.scopus.subjectUltra-violet
fei.scopus.subjectUV wavelength
fei.scopus.updated2025-02-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=79952472010&origin=inward

Arquivos

Coleções