A compact model and an extraction method for the FinFET spreading resistance

Página do item simplificado
dc.contributor.authorMarcelo Parada
dc.contributor.authorMALHEIRO, C. T.
dc.contributor.authorAGOPIAN, P. G. D.
dc.contributor.authorRenato Giacomini
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-0007-8142
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1060-2649
dc.date.accessioned2022-01-12T22:03:16Z
dc.date.available2022-01-12T22:03:16Z
dc.date.issued2011-09-02
dc.description.abstractThis work presents a study of the FinFET series resistance focused on the spreading component. A new simple analytical expression is proposed to easily estimate and model this parasitic parameter. The extraction method departs from the drain current versus gate voltage curves of several channel and source/drain lengths. The resistance values extracted from simulated devices are compared to the outputs of the analytic model and a very good agreement is achieved. The proposed model showed accurate estimative for a wider range of devices then previously published models. © The Electrochemical Society.
dc.description.firstpage255
dc.description.issuenumber1
dc.description.lastpage262
dc.description.volume39
dc.identifier.citationPARADADA, M.; MALHEIRO, C. T.; AGOPIAN, P. G. D.; GIACOMINI, R. A compact model and an extraction method for the FinFET spreading resistance. ECS Transactions, v. 39, n. 1, p. 255-262, September, 2011.
dc.identifier.doi10.1149/1.3615201
dc.identifier.issn1938-5862
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/4193
dc.relation.ispartofECS Transactions
dc.rightsAcesso Restrito
dc.titleA compact model and an extraction method for the FinFET spreading resistance
dc.typeArtigo de evento
fei.scopus.citations2
fei.scopus.eid2-s2.0-84856825679
fei.scopus.subjectAnalytic models
fei.scopus.subjectAnalytical expressions
fei.scopus.subjectCompact model
fei.scopus.subjectExtraction method
fei.scopus.subjectGate voltages
fei.scopus.subjectParasitic parameter
fei.scopus.subjectResistance values
fei.scopus.subjectSeries resistances
fei.scopus.subjectSpreading resistance
fei.scopus.updated2024-12-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84856825679&origin=inward
Arquivos
Coleções
Artigos