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On the origin of low-frequency noise of submicron Graded-Channel fully depleted SOI nMOSFETs

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dc.contributor.authorMOLTO, A. R.
dc.contributor.authorRodrigo Doria
dc.contributor.authorMichelly De Souza
dc.contributor.authorMarcelo Antonio Pavanello
dc.contributor.authorOrcidhttps://orcid.org/0000-0001-6472-4807
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-4448-4337
dc.date.accessioned2022-01-12T21:59:41Z
dc.date.available2022-01-12T21:59:41Z
dc.date.issued2015-08-31
dc.description.abstractThis paper deals with the Low-Frequency Noise (LFN) behavior of submicron Graded-Channel SOI nMOSFETs, fabricated in a 150 nm Technology from Oki Semiconductors as a continuation from previous works, looking at the noise sources of these devices. The effects of channel length reduction and gate bias dependence on the LFN of devices biased in linear regime are investigated. The effective trap density and the KF constant, which can be used in BSIM SPICE-like models, are determined.
dc.identifier.citationMOLTO, A. R.; DORIA, R.; DE SOUZA, M.; PAVANELLO, M. A. On the origin of low-frequency noise of submicron Graded-Channel fully depleted SOI nMOSFETs. In. SIMPOSIO DE TECNOLOGIA E DISPOSITIVOS MICROELETRÔNICOS, SBMICRO, 30, 2015, Salvador: SBMicro 2015 - 30º Simpósio de Tecnologia e Dispositivos Microeletrônicos, 2015.
dc.identifier.doi10.1109/SBMicro.2015.7298113
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/3949
dc.relation.ispartofSBMicro 2015 - 30th Symposium on Microelectronics Technology and Devices
dc.rightsAcesso Restrito
dc.subject.otherlanguagegraded channel
dc.subject.otherlanguageLow Frequecy Noise
dc.subject.otherlanguageNoise
dc.subject.otherlanguageSOI
dc.subject.otherlanguagesubmicron
dc.titleOn the origin of low-frequency noise of submicron Graded-Channel fully depleted SOI nMOSFETs
dc.typeArtigo de evento
fei.scopus.citations1
fei.scopus.eid2-s2.0-84961844200
fei.scopus.subjectChannel length
fei.scopus.subjectFully depleted SOI
fei.scopus.subjectGate bias dependence
fei.scopus.subjectGraded channels
fei.scopus.subjectLow Frequecy Noise
fei.scopus.subjectLow-Frequency Noise
fei.scopus.subjectNoise
fei.scopus.subjectSubmicron
fei.scopus.updated2025-02-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84961844200&origin=inward

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