Fin shape influence on the analog performance of standard and strained MuGFETs
| dc.contributor.author | BÜHLER, Rudolf Theoderich | |
| dc.contributor.author | MARTINO, J. A | |
| dc.contributor.author | AGOPIAN, P. G. D. | |
| dc.contributor.author | Renato Giacomini | |
| dc.contributor.author | SIMOEN, E. | |
| dc.contributor.author | CLAEYS, C. | |
| dc.contributor.authorOrcid | https://orcid.org/0000-0002-7934-9605 | |
| dc.contributor.authorOrcid | https://orcid.org/0000-0003-1060-2649 | |
| dc.date.accessioned | 2022-01-12T22:03:42Z | |
| dc.date.available | 2022-01-12T22:03:42Z | |
| dc.date.issued | 2010-10-14 | |
| dc.identifier.citation | BÜHLER, R. T.; MARTINO, J. A; AGOPIAN, P. G. D.; GIACOMINI, R.; SIMOEN, E.; CLAEYS, C. Fin shape influence on the analog performance of standard and strained MuGFETs. Proceedings - IEEE International SOI Conference, Oct. 2010. | |
| dc.identifier.doi | 10.1109/SOI.2010.5641387 | |
| dc.identifier.uri | https://repositorio.fei.edu.br/handle/FEI/4221 | |
| dc.relation.ispartof | Proceedings - IEEE International SOI Conference | |
| dc.rights | Acesso Restrito | |
| dc.title | Fin shape influence on the analog performance of standard and strained MuGFETs | |
| dc.type | Artigo de evento | |
| fei.scopus.citations | 10 | |
| fei.scopus.eid | 2-s2.0-78650530505 | |
| fei.scopus.updated | 2025-02-01 | |
| fei.scopus.url | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=78650530505&origin=inward |