Fin shape influence on the analog performance of standard and strained MuGFETs

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dc.contributor.authorBÜHLER, Rudolf Theoderich
dc.contributor.authorMARTINO, J. A
dc.contributor.authorAGOPIAN, P. G. D.
dc.contributor.authorRenato Giacomini
dc.contributor.authorSIMOEN, E.
dc.contributor.authorCLAEYS, C.
dc.contributor.authorOrcidhttps://orcid.org/0000-0002-7934-9605
dc.contributor.authorOrcidhttps://orcid.org/0000-0003-1060-2649
dc.date.accessioned2022-01-12T22:03:42Z
dc.date.available2022-01-12T22:03:42Z
dc.date.issued2010-10-14
dc.identifier.citationBÜHLER, R. T.; MARTINO, J. A; AGOPIAN, P. G. D.; GIACOMINI, R.; SIMOEN, E.; CLAEYS, C. Fin shape influence on the analog performance of standard and strained MuGFETs. Proceedings - IEEE International SOI Conference, Oct. 2010.
dc.identifier.doi10.1109/SOI.2010.5641387
dc.identifier.urihttps://repositorio.fei.edu.br/handle/FEI/4221
dc.relation.ispartofProceedings - IEEE International SOI Conference
dc.rightsAcesso Restrito
dc.titleFin shape influence on the analog performance of standard and strained MuGFETs
dc.typeArtigo de evento
fei.scopus.citations10
fei.scopus.eid2-s2.0-78650530505
fei.scopus.updated2024-07-01
fei.scopus.urlhttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=78650530505&origin=inward
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