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Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA under Radiation Effects

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Tipo de produção

Artigo

Data de publicação

2020-07-05

Texto completo (DOI)

Periódico

IEEE Transactions on Nuclear Science

Editor

Citações na Scopus

34

Autores

OLIVEIRA, A. B.
TAMBARA, L. A.
BENEVENUTI, F.
BENITES, L. A. C.
ADDED, N.
AGUIAR, V. A. P.
MEDINA, N. H.
Marcilei Aparecida Guazzelli
KASTENSMIDT, F. L.

Orientadores

Resumo

© 1963-2012 IEEE.This article evaluates the RISC-V Rocket processor embedded in a Commercial Off-The-Shelf (COTS) SRAM-based field-programmable gate array (FPGA) under heavy-ions-induced faults and emulation fault injection. We also analyze the efficiency of using mitigation techniques based on hardware redundancy and scrubbing. Results demonstrated an improvement of $3\times $ in the cross section when scrubbing and coarse grain triple modular redundancy are used. The Rocket processor presented analogous sensitivity to radiation effects as the state-of-the-art soft processors. Due to the complexity of the system-on-chip, not only the Rocket core but also its peripherals should be protected with proper solutions. Such solutions should address the specific vulnerabilities of each component to improve the overall system reliability while maintaining the trade-off with performance.

Citação

OLIVEIRA, A. B.; TAMBARA, L. A.; BENEVENUTI, F.; BENITES, L. A. C.; ADDED, N.; AGUIAR, V. A. P.; MEDINA, N. H.; GUAZZELLI, M. A.; KASTENSMIDT, F. L. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA under Radiation Effects.IEEE Transactions on Nuclear Science, v. 67, n. 7, p. 1503-1510, jul. 2020.

Palavras-chave

Keywords

Commercial Off-The-Shelf (COTS) SRAM-based field-programmable gate array (FPGA); fault injection (FI); fault tolerance; heavy ion; RISC-V; rocket

Assuntos Scopus

Fault injection; Hardware redundancy; Mitigation techniques; Proper solutions; Soft processors; State of the art; System reliability; Triple modular redundancy

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